scholarly journals Extraction of MOSFET threshold voltage, series resistance, effective channel length, and inversion layer mobility from small-signal channel conductance measurement

2001 ◽  
Vol 48 (12) ◽  
pp. 2870-2874 ◽  
Author(s):  
F.C.J. Kong ◽  
Y.T. Yeow ◽  
Z.Q. Yao
1994 ◽  
Vol 37 (12) ◽  
pp. 1943-1948 ◽  
Author(s):  
F.J. García Sánchez ◽  
A. Ortiz-Conde ◽  
M. García Núñez ◽  
R.L. Anderson

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