Non destructive examination of immersed structures within liquid sodium

The inspection and control of sodium-cooled fast reactors (SFR) is a major issue for the nuclear industry. Ultrasonic solutions are under study because of the opacity of liquid sodium. In this paper, the use of leaky Lamb waves is considered for non-destructive testing (NDT) on parallel and immersed structures assimilated as plates. The first phase of our approach involved studying the propagation properties of leaky Lamb waves. Equations that model the propagation of Lamb waves in an immersed plate were solved numerically. The phase velocity can be experimentally measured using a two dimensional Fourier transform. The group velocity can be experimentally measured using a short-time Fourier transform technique. Attenuation of leaky Lamb waves is mostly due to the re-emission of energy into the surrounding fluid, and it can be measured by these two techniques.

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First results of Non-destructive testing under liquid sodium at 200°C

2016 IEEE International Ultrasonics Symposium (IUS) ◽

10.1109/ultsym.2016.7728558 ◽

2016 ◽

Cited By ~ 1

Author(s):

Jean-Francois Saillant ◽

Regis Marlier ◽

Francois Baque

Keyword(s):

Liquid Sodium ◽

Non Destructive Testing ◽

Destructive Testing ◽

First Results ◽

Non Destructive

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Ultrasonic Transducer for Non-Destructive Testing of Structures Immersed in Liquid Sodium at 200 °C

Sensors ◽

10.3390/s19194156 ◽

2019 ◽

Vol 19 (19) ◽

pp. 4156 ◽

Cited By ~ 4

Author(s):

Saillant ◽

Marlier ◽

Navacchia ◽

Baqué

Keyword(s):

Ultrasonic Transducer ◽

Acoustic Properties ◽

Liquid Sodium ◽

Non Destructive Testing ◽

Destructive Testing ◽

Non Destructive

TUCSS transducer (French acronym standing for Transducteur Ultrasonore pour CND Sous Sodium) is designed for performing NDT (Non-Destructive Testing) under liquid sodium. Under sodium, the tests results obtained show that these transducers have sufficiently good acoustic properties to perform basic NDT of a structure immersed under liquid sodium at about 200 °C using conventional immersion ultrasonic technics. Artificial defects were made next to an X-shaped weld and could clearly be detected.

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Luminescence from individual dislocations in II-VI and III-V semiconductors

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100088488 ◽

1991 ◽

Vol 49 ◽

pp. 834-835

Author(s):

J W Steeds

Keyword(s):

Group Iv ◽

Luminescence Properties ◽

Carrier Recombination ◽

Transmission Electron ◽

Wide Range ◽

Basic Physics ◽

Semiconducting Compounds ◽

Diamond Group ◽

Non Destructive ◽

Technological Significance

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.

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Forensic Identifications Aided by Scanning Electron Microscopy of Silicone-Epoxy Microreplicas of Calcified and Cornified Structures

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117017 ◽

1975 ◽

Vol 33 ◽

pp. 678-679 ◽

Cited By ~ 3

Author(s):

R.F. Sognnaes

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Forensic Science ◽

George Washington ◽

Epithelial Surface ◽

Extended Application ◽

Tissue Surfaces ◽

Non Destructive ◽

Scanning Electron ◽

Surface Changes

Sufficient experience has been gained during the past five years to suggest an extended application of microreplication and scanning electron microscopy to problems of forensic science. The author's research was originally initiated with a view to develop a non-destructive method for identification of materials that went into objects of art, notably ivory and ivories. This was followed by a very specific application to the identification and duplication of the kinds of materials from animal teeth and tusks which two centuries ago went into the fabrication of the ivory dentures of George Washington. Subsequently it became apparent that a similar method of microreplication and SEM examination offered promise for a whole series of problems pertinent to art, technology and science. Furthermore, what began primarily as an application to solid substances has turned out to be similarly applicable to soft tissue surfaces such as mucous membranes and skin, even in cases of acute, chronic and precancerous epithelial surface changes, and to post-mortem identification of specific structures pertinent to forensic science.

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