Random pattern testability of the open defect detection method using application of time-variable electric field

Author(s):  
H. Yotsuyanagi ◽  
M. Hashizume ◽  
T. Iwakiri ◽  
M. Ichimiya ◽  
T. Tamesada
2021 ◽  
Vol 1754 (1) ◽  
pp. 012025
Author(s):  
Yang Cheng ◽  
Lingzhi Xia ◽  
Bo Yan ◽  
Jiang Chen ◽  
Dongsheng Hu ◽  
...  

Measurement ◽  
2020 ◽  
Vol 159 ◽  
pp. 107771 ◽  
Author(s):  
Xiaohui Cao ◽  
Wen Xie ◽  
Siddiqui Muneeb Ahmed ◽  
Cun Rong Li

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