CMOS open defect detection based on supply current in time-variable electric field and supply voltage application

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990269 ◽

2002 ◽

Author(s):

M. Hashizume ◽

M. Ichimiya ◽

H. Yotsuyanagi ◽

T. Tamesada

Keyword(s):

Electric Field ◽

Defect Detection ◽

Supply Voltage ◽

Time Variable ◽

Variable Electric Field ◽

Voltage Application ◽

Open Defect ◽

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Random pattern testability of the open defect detection method using application of time-variable electric field

Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 ◽

10.1109/delta.2002.994656 ◽

2003 ◽

Author(s):

H. Yotsuyanagi ◽

M. Hashizume ◽

T. Iwakiri ◽

M. Ichimiya ◽

T. Tamesada

Keyword(s):

Electric Field ◽

Defect Detection ◽

Detection Method ◽

Time Variable ◽

Random Pattern ◽

Variable Electric Field ◽

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Test pattern for supply current test of open defects by applying time-variable electric field

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dftvs.2001.966781 ◽

2002 ◽

Author(s):

H. Yotsuyanagi ◽

M. Hashizume ◽

T. Iwakiri ◽

M. Ichimiya ◽

T. Tamesada

Keyword(s):

Electric Field ◽

Test Pattern ◽

Time Variable ◽

Variable Electric Field ◽

Current Test ◽

Supply Current ◽

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CMOS open defect detection by supply current test

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915071 ◽

2002 ◽

Author(s):

M. Hashizume ◽

M. Ichimiya ◽

H. Yotsuyanagi ◽

T. Tamesada

Keyword(s):

Defect Detection ◽

Current Test ◽

Open Defect ◽

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On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection Technique for Cache Memory

2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS) ◽

10.1109/lascas51355.2021.9459175 ◽

2021 ◽

Author(s):

Sheetal Barekar ◽

Madan Mali

Keyword(s):

Defect Detection ◽

Detection Technique ◽

Cache Memory ◽

Test Time ◽

Chip Area ◽

Open Defect ◽

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Latent open defect detection using phase-sensitive nonlinearity detection technqiue

Microelectronics Reliability ◽

10.1016/0026-2714(96)84402-7 ◽

1996 ◽

Vol 36 (4) ◽

pp. 539

Keyword(s):

Defect Detection ◽

Phase Sensitive ◽

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Electrode conditioning characteristics in vacuum under impulse voltage application in non-uniform electric field

IEEE Transactions on Dielectrics and Electrical Insulation ◽

10.1109/tdei.2005.1394011 ◽

2005 ◽

Vol 12 (1) ◽

pp. 17-23 ◽

Author(s):

F. Miyazaki ◽

Y. Inagawa ◽

K. Kato ◽

M. Sakaki ◽

H. Ichikawa ◽

...

Keyword(s):

Electric Field ◽

Uniform Electric Field ◽

Voltage Application ◽

Impulse Voltage

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Electrokinetic remediation of mine tailings by applying a pulsed variable electric field

Minerals Engineering ◽

10.1016/j.mineng.2013.09.004 ◽

2014 ◽

Vol 55 ◽

pp. 52-56 ◽

Author(s):

Adrián Rojo ◽

Henrik K. Hansen ◽

Omara Monárdez

Keyword(s):

Electric Field ◽

Mine Tailings ◽

Electrokinetic Remediation ◽

Variable Electric Field

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Preparation of ZnO films with variable electric field-assisted atomic layer deposition technique

Applied Surface Science ◽

10.1016/j.apsusc.2014.02.097 ◽

2014 ◽

Vol 303 ◽

pp. 111-117 ◽

Author(s):

Weier Lu ◽

Yabin Dong ◽

Chaobo Li ◽

Yang Xia ◽

Bangwu Liu ◽

...

Keyword(s):

Atomic Layer Deposition ◽

Electric Field ◽

Atomic Layer ◽

Zno Films ◽

Deposition Technique ◽

Variable Electric Field ◽

Layer Deposition ◽

Atomic Layer Deposition Technique

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632. Experiments on the heating of ions in a trap fitted with magnetic plugs by a variable electric field

Vacuum ◽

10.1016/0042-207x(65)91120-6 ◽

1965 ◽

Vol 15 (7) ◽

pp. 381

Keyword(s):

Electric Field ◽

Variable Electric Field

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Solving time domain electric field Integral equation without the time variable

IEEE Transactions on Antennas and Propagation ◽

10.1109/tap.2005.861515 ◽

2006 ◽

Vol 54 (1) ◽

pp. 258-262 ◽

Author(s):

Zhong Ji ◽

T.K. Sarkar ◽

Baek Ho Jung ◽

Mengtao Yuan ◽

M. Salazar-Palma

Keyword(s):

Integral Equation ◽

Electric Field ◽

Time Domain ◽

Time Variable ◽

Electric Field Integral Equation ◽

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