Reliability study of Zinc Oxide thin-film transistor with High-K gate dielectric

2012 ◽  
Author(s):  
Dedong Han ◽  
Youfeng Geng ◽  
Jian Cai ◽  
Wei Wang ◽  
Liangliang Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Gate Dielectric ◽  
Thin Film Transistor ◽  
Oxide Thin Film ◽  
Zinc Oxide Thin Film ◽  
Reliability Study ◽  
High K ◽  
High K Gate Dielectric

scholarly journals Effect of top gate potential on bias-stress for dual gate amorphous indium-gallium-zinc-oxide thin film transistor

AIP Advances ◽  
2016 ◽  
Vol 6 (7) ◽  
pp. 075217 ◽  
Author(s):  
Minkyu Chun ◽  
Jae Gwang Um ◽  
Min Sang Park ◽  
Md Delwar Hossain Chowdhury ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistor ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Dual Gate ◽  
Gate Potential ◽  
Indium Gallium
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