Fault Detection And Input Stimulus Determination For The Testing Of Analog Integrated Circuits Based On Power-supply Current Monitoring

2005 ◽  
Author(s):  
G. Gielen ◽  
Zhihua Wang ◽  
W. Sansen
Keyword(s):  
Fault Detection ◽  
Integrated Circuits ◽  
Power Supply ◽  
Analog Integrated Circuits ◽  
Input Stimulus ◽  
Supply Current ◽  
Current Monitoring

Testing Analog Circuits by PCA of Power Supply Current

2012 ◽  
Vol 157-158 ◽  
pp. 641-645 ◽  
Author(s):  
Guo He ◽  
Chao Jie Zhang ◽  
Guang Hui Chang ◽  
Shu Hai Liang
Keyword(s):  
Fault Detection ◽  
Power Supply ◽  
Analog Circuits ◽  
Principal Component ◽  
General Rule ◽  
Component Model ◽  
Level Sensor ◽  
Supply Current ◽  
Principal Component Model ◽  
Liquid Level Sensor

A method using principal component analysis (PCA) of dynamic power supply current was proposed for testing of analog circuits in this paper. The basic model of the proposed method and the general rule for analog fault detection were described in detail. At first, the principal component model of fault-free circuits was constructed. Then the circuits-under-test was compared with the principal component model to calculate the statistic for fault detection. The features of power supply current in both time and frequency domain were combined by PCA, and it could overcome the difficulty to determine threshold by empirical knowledge. The proposed method was applied to detect faults of the signal filtering and amplifying circuit, which is used in the ultrasonic liquid-level sensor. The results show that the power supply current contains information about the circuit’s faults, and can be used for fault detection of analog circuits by analyzing this signal.

scholarly journals Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits

VLSI Design ◽  
1997 ◽  
Vol 5 (3) ◽  
pp. 223-240
Author(s):  
Mahmoud A. Al-Qutayri ◽  
Peter R. Shepherd
Keyword(s):  
Time Domain ◽  
Power Supply ◽  
Testing Technique ◽  
Mixed Signal ◽  
Single Fault ◽  
Mixed Signal Circuits ◽  
Supply Current ◽  
The Time Domain ◽  
Current Monitoring ◽  
Dynamic Power Supply Current

This paper applies the time-domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current measurements in detecting faults in CMOS mixed-signal circuits. The voltage and supply current (iDDT) measurements are analyzed by three methods to detect the presence of a fault, and to establish which measurement achieves higher confidence in the detection. Catastrophic, soft and stuck-at single fault conditions were introduced to the circuit-under-test (CUT). The time-domain technique tests a mixed-signal CUT in a unified fashion, thereby eliminating the need to partition the CUT into separate analogue and digital modules.

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