An efficient test pattern generator for high fault coverage in built-in-self-test applications
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2013 ◽
Vol 273
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pp. 840-844
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2012 ◽
Vol 8
(6)
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pp. 815-821
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2010 ◽
Vol 1
(4)
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pp. 1-12
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2020 ◽
Vol 9
(12)
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pp. 217-220
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2012 ◽
Vol 9
(9)
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pp. 1396-1406
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2010 ◽
Vol 39
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pp. 220-225
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