Low Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-Test

Journal of Computer Science ◽

10.3844/jcssp.2012.815.821 ◽

2012 ◽

Vol 8 (6) ◽

pp. 815-821 ◽

Author(s):

Madjid

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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Bit-swapping linear feedback shift register (LFSR) for power reduction using pre-charged XOR with multiplexer technique in built in self-test

Journal of Ambient Intelligence and Humanized Computing ◽

10.1007/s12652-020-02222-5 ◽

2020 ◽

Author(s):

S. Vijay Murugan ◽

B. Sathiyabhama

Keyword(s):

Power Reduction ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing

IET Computers & Digital Techniques ◽

10.1049/iet-cdt:20060114 ◽

2007 ◽

Vol 1 (4) ◽

pp. 369 ◽

Author(s):

M.-H. Yang ◽

Y. Kim ◽

Y. Park ◽

D. Lee ◽

S. Kang

Keyword(s):

Low Power ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Low Power Testing ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test ◽

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Novel Linear Feedback Shift Register with Look Ahead Clock Gating Technique for Dynamic Power Reduction in Built-In Self-Test

Journal of Nanoelectronics and Optoelectronics ◽

10.1166/jno.2016.1939 ◽

2016 ◽

Vol 11 (6) ◽

pp. 783-791

Author(s):

R. Manjith ◽

C. Muthukumari

Keyword(s):

Power Reduction ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Clock Gating ◽

Dynamic Power ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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The non-linear feedback shift-register as a built-in self-test (BIST) resource

International Test Conference 1988 Proceeding@m_New Frontiers in Testing ◽

10.1109/test.1988.207893 ◽

2003 ◽

Author(s):

P.N. Marinos

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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Design of lfsr (linear feedback shift register) for low power test pattern generator

2017 International Conference on Networks & Advances in Computational Technologies (NetACT) ◽

10.1109/netact.2017.8076788 ◽

2017 ◽

Author(s):

R. Saraswathi ◽

R. Manikandan

Keyword(s):

Low Power ◽

Test Pattern ◽

Pattern Generator ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Low Power Test ◽

Feedback Shift Register

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Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge–Response pair acquisition using Built-In Self-Test before shipping

Integration ◽

10.1016/j.vlsi.2019.12.002 ◽

2020 ◽

Vol 71 ◽

pp. 144-153

Author(s):

Yasuhiro Ogasahara ◽

Yohei Hori ◽

Toshihiro Katashita ◽

Tomoki Iizuka ◽

Hiromitsu Awano ◽

...

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Physical Unclonable Functions ◽

Response Pair ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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A Low Power Built-in Self-Test Scheme Based on Overlapping Bit Swapping Linear Feedback Shift Register

Journal of Low Power Electronics ◽

10.1166/jolpe.2013.1273 ◽

2013 ◽

Vol 9 (4) ◽

pp. 519-526 ◽

Author(s):

Bin Zhou ◽

Xinchun Wu ◽

Yu Sun ◽

Tianqi Wang ◽

Liyi Xiao

Keyword(s):

Low Power ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Test Scheme ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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An improved configurable 2-D linear feedback shift register for embedded core built-in self-test

2011 IEEE 43rd Southeastern Symposium on System Theory ◽

10.1109/ssst.2011.5753808 ◽

2011 ◽

Author(s):

Srinivasa Vemuru ◽

Sravani Kristem ◽

Mohammed Niamat

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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A review on power optimization of linear feedback shift register (LFSR) for Low power built in self test (BIST)

2011 3rd International Conference on Electronics Computer Technology ◽

10.1109/icectech.2011.5942075 ◽

2011 ◽

Author(s):

T. Saraswathi ◽

K. Ragini ◽

Ch. Ganapathy Reddy

Keyword(s):

Low Power ◽

Power Optimization ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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Bit-serial test pattern generation by an accumulator behaving as a non-linear feedback shift register

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030199 ◽

2003 ◽

Author(s):

G. Dimitrakopoulos ◽

D. Nikolos ◽

D. Bakalis

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Test Pattern Generation ◽

Serial Test ◽

Feedback Shift Register ◽

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