28-nm CMOS Resistor-Less Voltage Reference with Process Corner Compensation

Abstract Using a compact nanoprobing setup comprising eight probe tips attached to piezo-driven micromanipulators, various techniques for fault isolation are performed on 28 nm samples inside an SEM. The recently implemented Current Imaging technique is used to quickly image large arrays of contacts providing a means of locating faults.

Download Full-text

Specification. Harmonized system of quality assessment for electronic components. Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes

10.3403/00139263 ◽

1975 ◽

Keyword(s):

Quality Assessment ◽

Voltage Regulator ◽

Voltage Reference ◽

Electronic Components ◽

Precision Voltage

Download Full-text

Identificación de polaridad de los devanados en un motor trifásico de 6 terminales

Revista de Ingeniería Mecánica ◽

10.35429/jme.2019.9.3.13.19 ◽

2019 ◽

pp. 13-19

Author(s):

José Luis Viramontes-Reyna ◽

Josafat Moreno-Silva ◽

José Guadalupe Montelongo-Sierra ◽

Erasmo Velazquez-Leyva

Keyword(s):

Low Cost ◽

Voltage Reference ◽

Three Phase ◽

Voltage Phase ◽

The Law ◽

And Control

This document presents the results obtained from the application of the law of Lens to correctly identify the polarity of the windings in a three-phase motor with 6 exposed terminals, when the corresponding labeling is not in any situation; Prior to identifying the polarity, it should be considered to have the pairs of the three windings located. For the polarity, it is proposed to feed with a voltage of 12 Vrms to one of the windings, which are identified randomly as W1 and W2, where W1 is connected to the voltage phase of 12 Vrms of the signal and W2 to the voltage reference to 0V; by means of voltage induction and considering the law of Lens, the remaining 4 terminals can be identified and labeled as V1, V2, U1 and U2. For this process a microcontroller and control elements with low cost are used.

Download Full-text

High Speed 1-tap Decision Feedback Equalizer in 28 nm CMOS

The International Conference on Electrical Engineering ◽

10.21608/iceeng.2014.30495 ◽

2014 ◽

Vol 9 (9th) ◽

pp. 1-12

Author(s):

Mostafa Hosny ◽

Sameh Ibrahim ◽

DiaaEldin Khalil ◽

Mohamed Dessouky

Keyword(s):

High Speed ◽

Decision Feedback ◽

Decision Feedback Equalizer ◽

28 Nm

Download Full-text

Battery Losses In a MMC for BEVS Application

The Open Electrical & Electronic Engineering Journal ◽

10.2174/1874129001812010098 ◽

2018 ◽

Vol 12 (1) ◽

pp. 98-109 ◽

Cited By ~ 1

Author(s):

Adolfo Dannier ◽

Gianluca Brando ◽

Ivan Spina ◽

Diego Iannuzzi

Keyword(s):

Mathematical Model ◽

System Architecture ◽

Electrochemical Cell ◽

Voltage Source ◽

Modular Multilevel Converter ◽

Voltage Reference ◽

Sinusoidal Voltage ◽

Current Waveform ◽

Voltage Source Inverter ◽

Multilevel Converter

Objective:This paper analyses the Modular Multilevel Converter (MMC) topology, where each individual Sub Module (SM), in half bridge configuration, is directly fed by an elementary electrochemical cell.Methods:The aim is to investigate how the reference voltages influence the cells currents waveforms, determining how the active powers and the losses are distributed among the cells. Considering a 2-level Voltage Source Inverter (VSI) topology working in the same conditions, the ratio between the MMC total cells losses and VSI total cells losses is calculated. After showing the system architecture and mathematical model, the cells current waveform investigation is presented and detailed both for triangular and sinusoidal voltage reference waveform.Results:Finally, the results are critically discussed with particular focus on the comparison between the MMC and the VSI topologies.

Download Full-text