An on-chip, attofarad interconnect charge-based capacitance measurement (CBCM) technique

Author(s):  
J.C. Chen ◽  
B.W. McGaughy ◽  
D. Sylvester ◽  
Chenming Hu
2021 ◽  
Vol 11 (2) ◽  
pp. 22
Author(s):  
Umberto Ferlito ◽  
Alfio Dario Grasso ◽  
Michele Vaiana ◽  
Giuseppe Bruno

Charge-Based Capacitance Measurement (CBCM) technique is a simple but effective technique for measuring capacitance values down to the attofarad level. However, when adopted for fully on-chip implementation, this technique suffers output offset caused by mismatches and process variations. This paper introduces a novel method that compensates the offset of a fully integrated differential CBCM electronic front-end. After a detailed theoretical analysis of the differential CBCM topology, we present and discuss a modified architecture that compensates mismatches and increases robustness against mismatches and process variations. The proposed circuit has been simulated using a standard 130-nm technology and shows a sensitivity of 1.3 mV/aF and a 20× reduction of the standard deviation of the differential output voltage as compared to the traditional solution.


2016 ◽  
Vol 32 (3) ◽  
pp. 393-397 ◽  
Author(s):  
Dongdi Zhu ◽  
Jiongjiong Mo ◽  
Shiyi Xu ◽  
Yongheng Shang ◽  
Zhiyu Wang ◽  
...  

2015 ◽  
Vol 31 (3) ◽  
pp. 329-333
Author(s):  
Xiao Peng Yu ◽  
Rong Qian Tian ◽  
Wen Lin Xu ◽  
Zheng Shi

1984 ◽  
Vol 5 (10) ◽  
pp. 395-397 ◽  
Author(s):  
J. Oristian ◽  
H. Iwai ◽  
J. Walker ◽  
R. Dutton

2010 ◽  
Vol 49 (1) ◽  
pp. 01AG05 ◽  
Author(s):  
Yusmeeraz Yusof ◽  
Kiyomasa Sugimoto ◽  
Hiroaki Ozawa ◽  
Shigeyasu Uno ◽  
Kazuo Nakazato

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