High Current Drive in Ultra-Short Impact Ionization MOS (I-MOS) Devices

Author(s):  
C. Charbuillet ◽  
S. Monfray ◽  
E. Dubois ◽  
P. Bouillon ◽  
F. Judong ◽  
...  
2019 ◽  
Vol 203 ◽  
pp. 02003
Author(s):  
Young-soon Bae

The off-axis current drive using electron cyclotron (EC) wave is typically very low due to the low density and temperature and electron trapping effect when it is launched from outside midplane. However, the heating and current drive by EC wave is being regarded as a essential element as an off-axis current drive source together with lower hybrid current drive (LHCD) for advanced tokamak operation research in KSTAR in future. Therefore, the reliable and high efficient ECCD using top launch has been studied for two different launch schemes of down-shift and up-shift resonance with various EC frequencies which will be available in the future KSTAR ECRH system. The ray tracing (GENRAY) simulation studies show that a broad ECCD profile peaked off axis is obtained with a high current drive efficiency for both schemes. It is almost twice as high as that of the outside midplane launch for the fundamental O-mode EC wave.


2002 ◽  
Vol 46 (3) ◽  
pp. 337-342 ◽  
Author(s):  
B. Marchand ◽  
B. Cretu ◽  
G. Ghibaudo ◽  
F. Balestra ◽  
D. Blachier ◽  
...  

2015 ◽  
Vol 12 (24) ◽  
pp. 20150953-20150953 ◽  
Author(s):  
Yen-Chia Chu ◽  
Nabi Sertac Artan ◽  
Dariusz Czarkowski ◽  
Le-Ren Chang-Chien ◽  
Jonathan Chao

2020 ◽  
Vol 51 (1) ◽  
pp. 1474-1477
Author(s):  
Chenglin Li ◽  
Dewei Zhang ◽  
Weiling Zeng ◽  
Hesheng Lin ◽  
Min Zhang

2004 ◽  
Vol 25 (6) ◽  
pp. 411-413 ◽  
Author(s):  
A.M. Ionescu ◽  
S. Mahapatra ◽  
V. Pott

1984 ◽  
Vol 33 ◽  
Author(s):  
A. N. Khondker ◽  
S. S. Ahmed ◽  
T. Liou ◽  
D. M. Kim

ABSTRACTConductivity in bulk polysilicon is discussed, applicable over a wide range of dopant concentration, temperature, grain size and trap density. The I-V behavior in a lateral poly p-n junction is analytically modeled, incorporating the effects of carrier lifetime operative in crystalline grain and amorphous conducting boundary. In particular, the extremely short carrier lifetime within the grain boundary is shown to provide an ohmic conduction channel in a direction parallel to current flow. This ohmic current can account for the unusually high current levels observed at small applied voltages. Also, the shift of the threshold voltage of MOS devices, as influenced by grain traps near the channel region, is analysed.


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