Cycling-induced degradation of metal-oxide resistive switching memory (RRAM)

Author(s):  
Z.-Q. Wang ◽  
S. Ambrogio ◽  
S. Balatti ◽  
S. Sills ◽  
A. Calderoni ◽  
...  
2015 ◽  
Vol 1 (8) ◽  
pp. 1500061 ◽  
Author(s):  
Jian-Shiou Huang ◽  
Yung-Chang Lin ◽  
Hung-Wei Tsai ◽  
Wen-Chun Yen ◽  
Chia-Wei Chen ◽  
...  

2016 ◽  
Vol 63 (11) ◽  
pp. 4279-4287 ◽  
Author(s):  
Zhongqiang Wang ◽  
Stefano Ambrogio ◽  
Simone Balatti ◽  
Scott Sills ◽  
Alessandro Calderoni ◽  
...  

2015 ◽  
Vol 118 (11) ◽  
pp. 114903 ◽  
Author(s):  
Abhishek A. Sharma ◽  
Ilya V. Karpov ◽  
Roza Kotlyar ◽  
Jonghan Kwon ◽  
Marek Skowronski ◽  
...  

2011 ◽  
Vol 58 (8) ◽  
pp. 2729-2737 ◽  
Author(s):  
Shimeng Yu ◽  
Yi Wu ◽  
Rakesh Jeyasingh ◽  
Duygu Kuzum ◽  
H.-S. Philip Wong

Sign in / Sign up

Export Citation Format

Share Document