AEP-LDPC ECC with Error Dispersion Coding for Burst Error Reduction of 2D and 3D NAND Flash Memories

2017 ◽  
Author(s):  
Toshiki Nakamura ◽  
Yoshiaki Deguchi ◽  
Ken Takeuchi
Keyword(s):  
Error Reduction ◽  
Nand Flash ◽  
Flash Memories ◽  
Burst Error ◽  
2D And 3D

A full 2D and 3D TCAD simulation of ultimate 22nm NAND Flash memories

2009 ◽  
Author(s):  
J. Postel-Pellerin ◽  
F. Lalande ◽  
P. Canet ◽  
R. Bouchakour ◽  
F. Jeuland ◽  
...  
Keyword(s):  
Nand Flash ◽  
Flash Memories ◽  
Tcad Simulation ◽  
2D And 3D

A Heavy-ion Beam Monitor Based on 3D NAND Flash Memories

2021 ◽  
pp. 1-1
Author(s):  
S. Gerardin ◽  
M. Bagatin ◽  
A. Paccagnella ◽  
S. Beltrami ◽  
A. Costantino ◽  
...  
Keyword(s):  
Ion Beam ◽  
Heavy Ion ◽  
Nand Flash ◽  
Flash Memories ◽  
Beam Monitor ◽  
Heavy Ion Beam

Improving Read Disturb Characteristics by Self-Boosting Read Scheme for Multilevel NAND Flash Memories

2009 ◽  
Vol 48 (4) ◽  
pp. 04C062 ◽  
Author(s):  
Myounggon Kang ◽  
Ki-Tae Park ◽  
Youngsun Song ◽  
Soonwook Hwang ◽  
Byung Yong Choi ◽  
...  
Keyword(s):  
Nand Flash ◽  
Flash Memories

Triple-Level-Cell/Single-Level-Cell Mix-Mode Operation Induced Data Retention Degradation in 3-D NAND Flash Memories

2021 ◽  
pp. 1-1
Author(s):  
Yu-Heng Liu ◽  
Yu-Siang Yang ◽  
Chih-Yuan Tseng ◽  
Wei Lin ◽  
An-Chang Liu ◽  
...  
Keyword(s):  
Nand Flash ◽  
Data Retention ◽  
Flash Memories ◽  
Single Level ◽  
Mode Operation
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