Role of sheet resistance and magnetic loss on a near field noise suppression effect of magnetic thin films attached on a microwave transmission line

Author(s):  
S. Ohnuma ◽  
T. Iwasa ◽  
H. Ono ◽  
M. Yamaguchi ◽  
T. Masumoto
2003 ◽  
Vol 93 (10) ◽  
pp. 8002-8004 ◽  
Author(s):  
Ki Hyeon Kim ◽  
Masahiro Yamaguchi ◽  
Ken-Ichi Arai ◽  
Hideaki Nagura ◽  
Shigehiro Ohnuma

2004 ◽  
Vol 40 (4) ◽  
pp. 2712-2715 ◽  
Author(s):  
S. Ohnuma ◽  
H. Nagura ◽  
H. Fujimori ◽  
T. Masumoto

Author(s):  
L. Tang ◽  
G. Thomas ◽  
M. R. Khan ◽  
S. L. Duan

Cr thin films are often used as underlayers for Co alloy magnetic thin films, such as Co1, CoNi2, and CoNiCr3, for high density longitudinal magnetic recording. It is belived that the role of the Cr underlayer is to control the growth and texture of the Co alloy magnetic thin films, and, then, to increase the in plane coercivity of the films. Although many epitaxial relationship between the Cr underlayer and the magnetic films, such as ﹛1010﹜Co/ {110﹜Cr4, ﹛2110﹜Co/ ﹛001﹜Cr5, ﹛0002﹜Co/﹛110﹜Cr6, have been suggested and appear to be related to the Cr thickness, the texture of the Cr underlayer itself is still not understood very well. In this study, the texture of a 2000 Å thick Cr underlayer on Nip/Al substrate for thin films of (Co75Ni25)1-xTix dc-sputtered with - 200 V substrate bias is investigated by electron microscopy.


1994 ◽  
Vol 354 ◽  
Author(s):  
Anthony S. Nazareth ◽  
Harsh Deep Chopra ◽  
D. K. Sood ◽  
R. B. Zmood

AbstractA focussing grid broad beam Kaufman source, using argon ions on a target of nominal composition Nd2Fei4B has been employed to sputter deposit magnetic thin films of thicknesses ranging from 800 â to 1300 â on silicon-(lll) substrates at room temperature. These films were characterised for their composition depth profile by Rutherford Backscattering Spectroscopy, while x-ray diffraction was used to study the crystallographic structure. Due to a close match between (111) Si with (220) Nd2Fej4B lattice spacings, preferred crystallographic texturing was expected, and experimental results showed a greatly enhanced (220) texture. The degradation in magnetic properties was attributed to the presence of oxygen in the films as indicated by concentration depth profiles. It is premised that another significant role of oxygen may be to relieve the misfit strain across the interface by its incorporation within the Nd2Fej4B phase.


2003 ◽  
Vol 532-535 ◽  
pp. 63-69 ◽  
Author(s):  
R. Belkhou ◽  
R. Flammini ◽  
M. Marsi ◽  
A. Taleb-Ibrahimi ◽  
L. Gregoratti ◽  
...  

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