Structure-Property Relationship of Ion-Beam Sputtered Nd-Fe-B Magnetic Thin Films On (111) Silicon

1994 ◽  
Vol 354 ◽  
Author(s):  
Anthony S. Nazareth ◽  
Harsh Deep Chopra ◽  
D. K. Sood ◽  
R. B. Zmood
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Magnetic Thin Films ◽  
Misfit Strain ◽  
Crystallographic Structure ◽  
Nominal Composition ◽  
Structure Property ◽  
X Ray Diffraction ◽  
Relationship Of

AbstractA focussing grid broad beam Kaufman source, using argon ions on a target of nominal composition Nd2Fei4B has been employed to sputter deposit magnetic thin films of thicknesses ranging from 800 â to 1300 â on silicon-(lll) substrates at room temperature. These films were characterised for their composition depth profile by Rutherford Backscattering Spectroscopy, while x-ray diffraction was used to study the crystallographic structure. Due to a close match between (111) Si with (220) Nd2Fej4B lattice spacings, preferred crystallographic texturing was expected, and experimental results showed a greatly enhanced (220) texture. The degradation in magnetic properties was attributed to the presence of oxygen in the films as indicated by concentration depth profiles. It is premised that another significant role of oxygen may be to relieve the misfit strain across the interface by its incorporation within the Nd2Fej4B phase.

Composition/structure/property relations of multi-ion-beam reactive sputtered lead lanthanum titanate thin films: Part III. Electrical properties

1993 ◽  
Vol 8 (9) ◽  
pp. 2203-2215 ◽  
Author(s):  
G.R. Fox ◽  
S.B. Krupanidhi
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Perovskite Phase ◽  
Ion Beam ◽  
Crystallographic Structure ◽  
Structure Property ◽  
Lanthanum Titanate ◽  
Percolation Effect ◽  
Composition Structure ◽  
High Dielectric

This paper, the third and final of a three part series, presents the electrical properties of postdeposition annealed, lead lanthanum titanate (PLT) thin films deposited by multi-ion-beam reactive sputtering (MIBERS). Also, a model is presented that explains the relations among composition, crystallographic structure, microstructure, and electrical properties of the PLT thin films. Thin films of PLT consisting of the perovskite phase exhibit 〈100〉 textured microstructures. Addition of a critical quantity of excess PbO results in the loss of this 〈100〉 texture, and continuity of the perovskite phase is disrupted while both excess PbO and porosity phases become continuous due to a percolation effect. Films with textured microstructures consisting of a continuous perovskite phase exhibit relatively high dc resistivities, high dielectric permittivities, and high remanent polarizations. At the transition between textured and nontextured microstructures, a discontinuous drop in the electrical properties occurs due to the ensuing continuity of the excess PbO and porosity. These composition-induced changes in the electrical properties were quantitatively modeled by applying a simple mixing rule model to the microstructure model developed in Part II of this series.

Thermoelectric Properties of B12+xC3-x Thin Films Prepared by Pulsed Ion-Beam Evaporation

2001 ◽  
Vol 697 ◽  
Author(s):  
Hisayuki Suematsu ◽  
Kazuo Kitajima ◽  
Ichiro Ruiz ◽  
Tetsuo Suzuki ◽  
Weihua Jiang ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermoelectric Properties ◽  
Room Temperature ◽  
Ion Beam ◽  
Nominal Composition ◽  
X Ray Diffraction ◽  
Substrate Heating ◽  
Glass Substrates ◽  
Ablation Plasma ◽  
A Current

AbstractThin films of boron carbide (B12+xC3-x) were prepared on glass substrates by a pulsed ion-beam evaporation method. A pulsed proton beam with an energy of 1 MV (peak) and a current of 60 kA was focused on sintered B12+xC3-x targets. Ablation plasma was formed from the irradiated targets and thin films were prepared on Pyrex and SiO2 glass substrates at room temperature. From results of X-ray diffraction, the thin films consisted of a B12+xC3-x phase. Using a known relationship between the composition and the lattice parameters, the composition of B12+x1C3-x thin films was estimated to be x = 0.3 and 1.0, which were close to the nominal composition of the targets. These results indicate that B12+x1C3-x with different carbon contents has been successfully prepared by IBE without substrate heating or sample annealing. Thermoelectric properties of the thin films were measured. A B12+x1C3-x thin film with estimated composition of x =0.9 exhibited the highest power factor at room temperature among the B12+x1C3-x samples reported.

Composition/structure/property relations of multi-ion-beam reactive sputtered lead lanthanum titanate thin films: Part I. Composition and structure analysis

1992 ◽  
Vol 7 (11) ◽  
pp. 3039-3055 ◽  
Author(s):  
G.R. Fox ◽  
S.B. Krupanidhi ◽  
K.L. More ◽  
L.F. Allard
Keyword(s):  
Thin Films ◽  
Physical Vapor Deposition ◽  
Ion Beam ◽  
Ferroelectric Properties ◽  
Crystallographic Structure ◽  
Zone Model ◽  
Structure Property ◽  
Lanthanum Titanate ◽  
Porous Microstructures ◽  
Structure And Microstructure

Material properties are greatly dependent upon the structure of the material. This paper, the first of three parts, discusses how composition influences the crystallographic structure and microstructure of lead lanthanum titanate (PLT) thin films grown by the multi-ion-beam reactive sputtering (MIBERS) technique. A transmission electron microscopy (TEM) study detailing the relationship between crystallographic texturing and microstructure development will be presented in a second paper. The dependence of the ferroelectric properties on observed crystallographic structure and microstructure is presented in the third paper of this series. As-deposited PLT microstructures coincide with the structure zone model (SZM) which has been developed to describe the microstructure of thin films deposited by physical vapor deposition. The as-deposited PLT structures are altered during post-deposition annealing as a result of crystallization and PbO evaporation. Amorphous films with more than 10 mole % excess PbO become polycrystalline with porous microstructures after annealing. When there is less PbO in the as-deposited film, 〈100〉 texture and dense structures are observed. Porosity results from PbO evaporation, and 〈100〉 texture is inhibited by excess PbO.

Transmission Electron Microscopy studies of texture of Cr underlayer of magnetic recording hard disk

1991 ◽  
Vol 49 ◽  
pp. 580-581
Author(s):  
L. Tang ◽  
G. Thomas ◽  
M. R. Khan ◽  
S. L. Duan
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Magnetic Thin Films ◽  
Magnetic Films ◽  
Substrate Bias ◽  
Epitaxial Relationship ◽  
Transmission Electron

Cr thin films are often used as underlayers for Co alloy magnetic thin films, such as Co1, CoNi2, and CoNiCr3, for high density longitudinal magnetic recording. It is belived that the role of the Cr underlayer is to control the growth and texture of the Co alloy magnetic thin films, and, then, to increase the in plane coercivity of the films. Although many epitaxial relationship between the Cr underlayer and the magnetic films, such as ﹛1010﹜Co/ {110﹜Cr4, ﹛2110﹜Co/ ﹛001﹜Cr5, ﹛0002﹜Co/﹛110﹜Cr6, have been suggested and appear to be related to the Cr thickness, the texture of the Cr underlayer itself is still not understood very well. In this study, the texture of a 2000 Å thick Cr underlayer on Nip/Al substrate for thin films of (Co75Ni25)1-xTix dc-sputtered with - 200 V substrate bias is investigated by electron microscopy.

Structure-Property Relationship of Dodecylbenzenesulfonic Acid Doped Polyaniline

2013 ◽  
Vol 721 ◽  
pp. 199-205 ◽  
Author(s):  
Ying Liu ◽  
Qi Wen ◽  
Jia Li Guan ◽  
Shi Jie Zhao ◽  
Qi Xing Hu ◽  
...  
Keyword(s):  
Molecular Weight ◽  
Ammonium Persulfate ◽  
Degree Of Crystallinity ◽  
Structure Property ◽  
X Ray Diffraction ◽  
Electrospinning Technique ◽  
Dodecylbenzenesulfonic Acid ◽  
Molar Ratios ◽  
Liquid Crystal Property ◽  
Relationship Of

Dodecylbenzenesulfonic acid (DBSA) doped polypanilines (PANIs) were chemically synthesized in different molar ratios of aniline (An) to ammonium persulfate (APS) and An to DBSA. The microstructures of these PANIs were investigated by means of scanning electron microscope (SEM), X-ray diffraction (XRD), and Fourier Transform Infrared (FTIR). UV-Vis spectrometer, semiconductor parameter analyzer, ubbelohde viscometer and electrospinning technique were used to characterize the optical, electrical properties, viscosity and solubility of these PANIs. The results show that the molar rations of An to APS and An to DBSA had strong effect on the microstructure, molecular weight, degree of crystallinity, optical property, solubility and conductivity of obtained DBSA doped PANI. With the increase of the molar ratios of An to APS and An to DBSA, the conductivities and molecular weight of DBSA doped PANIs decreased, while the degree of crystallinity and solubility of DBSA doped PANIs increased. The DBSA doped PANI could dissolve in dichloromethane or HFIP and could be fabricated short fibers by electrospinning. Moreover, the solution of DBSA doped PANIs in concentrated sulphuric acid showed liquid crystal property.

Ion beam sputter deposition of layered magnetic thin films

1983 ◽  
Vol 35 (1-3) ◽  
pp. 89-92 ◽  
Author(s):  
J.W. Smits ◽  
H.A. Algra ◽  
U. Enz ◽  
R.P. van Stapele
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Magnetic Thin Films ◽  
Sputter Deposition ◽  
Ion Beam Sputter Deposition

D-61 Grazing-Incident X-ray Diffraction Analyses of Novel Magnetic Thin Films—Invited

2004 ◽  
Vol 19 (2) ◽  
pp. 195-195
Author(s):  
K. Inaba ◽  
Y. Ito ◽  
K. Omote ◽  
H. Toraya
Keyword(s):  
Thin Films ◽  
Magnetic Thin Films ◽  
X Ray Diffraction ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document