Open-Circuit Fault detection and localization for a Three-Phase Gird-Connected Active Neutral Point Clamped Inverter

Author(s):  
Aydin Mehdizadeh ◽  
Seyed Hamid Montazeri ◽  
Jafar Milimonfared
2019 ◽  
Vol 63 (3) ◽  
pp. 169-177
Author(s):  
Mohamed Amine Khelif ◽  
Azeddine Bendiabdellah ◽  
Bilal Djamal Eddine Cherif

Currently, with the power electronics evolution, a major research axis is oriented towards the diagnosis of converters supplying induction machines. Indeed, a converter such as the inverter is susceptible to have structural failures such as faulty leg and/or open-circuit IGBT faults. In this paper, the detection of the faulty leg and the localization of the open-circuit switch of an inverter are investigated. The fault detection technique used in this work is based essentially upon the monitoring of the root mean square (RMS) value and the calculation of the mean value of the three-phase currents. In the first part of the paper work, the faulty leg is detected by monitoring the RMS value of the three-phase currents and comparing them to the nominal value of the phase current. The second part, the open-circuit IGBT fault is localized simply by knowing the polarity of the calculated mean value current of the faulty phase. The work is first accomplished using simulation work and then the obtained simulation results are validated by experimental work conducted in our LDEE laboratory to illustrate the effectiveness, simplicity and rapidity of the proposed technique.


2019 ◽  
Vol 5 (2) ◽  
pp. 416-432 ◽  
Author(s):  
Anton Kersten ◽  
Karl Oberdieck ◽  
Andreas Bubert ◽  
Markus Neubert ◽  
Emma Arfa Grunditz ◽  
...  

Electronics ◽  
2020 ◽  
Vol 9 (9) ◽  
pp. 1437
Author(s):  
Sang-Hun Kim ◽  
Seok-Min Kim ◽  
Sungmin Park ◽  
Kyo-Beum Lee

This paper proposes a fault-detection method for open-switch failures in hybrid active neutral-point-clamped (HANPC) rectifiers. The basic HANPC topology comprises two SiC-based metal-oxide-semiconductor field-effect transistors (MOSFETs) and four Si insulated-gate bipolar transistors (IGBTs). A three-phase rectifier system using the HANPC topology can produce higher efficiency and lower current harmonics. An open-switch fault in a HANPC rectifier can be a MOSFET or IGBT fault. In this work, faulty cases of six different switches are analyzed based on the current distortion in the stationary reference frame. Open faults in MOSFET switches cause immediate and remarkable current distortions, whereas, open faults in IGBT switches are difficult to detect using conventional methods. To detect an IGBT fault, the proposed detection method utilizes some of the reactive power in a certain period to make an important difference, using the direct-quadrant (dq)-axis current information derived from the three-phase current. Thus, the proposed detection method is based on three-phase current measurements and does not use additional hardware. By analyzing the individual characteristics of each switch failure, the failed switch can be located exactly. The effectiveness and feasibility of the proposed fault-detection method are verified through PSIM simulations and experimental results.


10.29007/34bz ◽  
2019 ◽  
Author(s):  
Masoud Alajmi ◽  
Sultan Aljahdali ◽  
Sultan Alsaheel ◽  
Mohammed Fattah ◽  
Mohammed Alshehri

Solar energy, one of many types of renewable energy, is considered to be an excellent alternative to non-renewable energy sources. Its popularity is increasing rapidly, especially because fuel energy consumes and depletes finite natural resources, polluting the environment, whereas solar energy is low- cost and clean. To produce a reliable supply of energy, however, solar energy must also be consistent. The energy we derive from a photovoltaic (PV) array is dependent on changeable factors such as sunlight, positioning of the array, covered area, and status of the solar cell. Every change adds potential for the creation of error in the array. Therefore, thorough research and a protocol for fast, efficient location and correction of all kinds of errors must be an urgent priority for researchers.For this project we used machine learning (ML) with voltage and current sensors to detect, localize and classify common faults including open circuit, short circuit, and hot-spot. Using the proposed algorithm, we have improved the accuracy of fault detection, classification and localization to 100%. Further, the proposed method can execute all three tasks (detection, classification, and localization) simultaneously.


Author(s):  
Florent Becker ◽  
Ehsan Jamshidpour ◽  
Philippe Poure ◽  
Shahrokh Saadate

In this paper, an open-switch fault diagnosis method for five-level H-Bridge Neutral Point Piloted (HB-NPP) or T-type converters is proposed. While fault tolerant operation is based on three steps (fault detection, fault localization and system reconfiguration), a fast fault diagnosis, including both fault detection and localization, is mandatory to make a suitable response to an open-circuit fault in one of the switches of the converter. Furthermore, fault diagnosis is necessary in embedded and safety critical applications, to prevent further damage and perform continuity of service.In this paper, we present an open-switch fault diagnosis method, based on the switches control orders and the observation of the converter output voltage level. In five-level converters such as HB-NPP and T-type topologies, some switches are mostly 'on' at the same time. Therefore, the fault localization is quite complicated. The fault diagnosis method we proposed is capable to detect and localize an open-switch fault in all cases. Computer simulations are carried out by using Matlab Simulink and SimPowerSystem toolbox to validate the proposed approach.


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