Reliability tests on micro-insert die bonding technology

Author(s):  
Antoine Nowodzinski ◽  
Herve Boutry ◽  
Remy Franiatte ◽  
Vincent Mandrillon ◽  
Romain Anciant ◽  
...  
Author(s):  
H. Tanabe ◽  
I. Shibata ◽  
K. Nihei ◽  
K. Miyaki

Optik ◽  
2021 ◽  
Vol 235 ◽  
pp. 166632
Author(s):  
Peidong Xu ◽  
Bin Wang ◽  
Yong Wang ◽  
Xiantao Wang

Author(s):  
Jinglong Li ◽  
Motohiko Masuda ◽  
Yi Che ◽  
Miao Wu

Abstract Die attach is well known in die bonding process. Its electrical character is simple. But some failures caused by die attach are not so simple. And it is not proper to analyze by a generic analysis flow. The analysis of two failures caused by die attach are presented in this paper.


Sign in / Sign up

Export Citation Format

Share Document