Fuzzy Controller Design for Atomic Force Microscope System

2008 ◽  
Author(s):  
Her-Terng Yau ◽  
Cheng-Chi Wang ◽  
Chao-Lin Kuo ◽  
Ming-Jyi Jang ◽  
Yuan-Hung Su
Keyword(s):  
Atomic Force Microscope ◽  
Fuzzy Controller ◽  
Controller Design ◽  
Atomic Force

A Finite-Impulse-Response-Based Approach to Control Acoustic-Caused Probe-Vibration in Atomic Force Microscope Imaging

2017 ◽  
Author(s):  
Sicheng Yi ◽  
Qingze Zou
Keyword(s):  
Atomic Force Microscope ◽  
Impulse Response ◽  
Controller Design ◽  
Finite Impulse Response ◽  
Feedforward Control ◽  
Acoustic Noise ◽  
Noise Cancellation ◽  
Control Approach ◽  
Atomic Force ◽  
Afm Imaging

In this paper, we propose a finite-impulse-response (FIR)-based feedforward control approach to mitigate the acoustic-caused probe vibration during atomic force microscope (AFM) imaging. Compensation for the extraneous probe vibration is needed to avoid the adverse effects of environmental disturbances such as acoustic noise on AFM imaging, nanomechanical characterization, and nanomanipulation. Particularly, residual noise still exists even though conventional passive noise cancellation apparatus has been employed. The proposed technique exploits a data-driven approach to capture both the noise propagation dynamics and the noise cancellation dynamics in the controller design, and is illustrated through the experimental implementation in AFM imaging application.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

Path Tracking Controller Design of Automatic Guided Vehicle Based on Four-Wheeled Omnidirectional Motion Model

2020 ◽  
Vol 17 (2) ◽  
pp. 7996-8010
Author(s):  
X. Wu ◽  
Y. Yang
Keyword(s):  
Control System ◽  
Fuzzy Controller ◽  
Controller Design ◽  
Threshold Value ◽  
Position Angle ◽  
Path Tracking ◽  
Global Coordinate System ◽  
Automatic Guided Vehicle ◽  
Input Variables ◽  
Industrial Pc

This paper presents a new design of omnidirectional automatic guided vehicle based on a hub motor, and proposes a joint controller for path tracking. The proposed controller includes two parts: a fuzzy controller and a multi-step predictive optimal controller. Firstly, based on various steering conditions, the kinematics model of the whole vehicle and the pose (position, angle) model in the global coordinate system are introduced. Secondly, based on the modeling, the joint controller is designed. Lateral deviation and course deviation are used as the input variables of the control system, and the threshold value is switched according to the value of the input variable to realise the correction of the large range of posture deviation. Finally, the joint controller is implemented by using the industrial PC and the self-developed control system based on the Freescale minimum system. Path tracking experiments were made under the straight and circular paths to test the ability of the joint controller for reducing the pose deviation. The experimental results show that the designed guided vehicle has excellent ability to path tracking, which meets the design goals.

The application of atomic force microscope in microbiological research

2014 ◽  
Vol 5 (1) ◽  
pp. 27-30
Author(s):  
Małgorzata Tokarska-Rodak ◽  
Maria Kozioł-Montewka ◽  
Jolanta Paluch-Oleś ◽  
Dorota Plewik ◽  
Grażyna Olchowik ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Microbiological Research

Failure Analysis of Laser Blown Metal Fuse Failures in Submicron Technology by C-AFM

2006 ◽  
Author(s):  
Liang-Feng Wen ◽  
Chien-Hui Chen ◽  
Allen Timothy Chang
Keyword(s):  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Laser Cutting ◽  
Spot Size ◽  
Repair Rate ◽  
Atomic Force ◽  
Measurement Laser

Abstract This paper presents a method of using a conductive atomic force microscope (C-AFM) to characterize a submicron metal fuse that has been blown open inadequately by laser. In order to obtain a proper I-V curve measured using the C-AFM without affecting the incompletely opened fuse, the paper proposes a method of preserving the fuse by coating its surface with spin-on glass. The paper explains how differences in laser cutting machines resulted in the high failure repair rate of customer product despite equivalent energy and spot size settings. Analysis of the fuse bank circuitry on wafers helped to find the critical physical differences between a fully blown and a poorly blown fuse. By overcoming difficulties in preserving the blown fuse failure sites for C-AFM measurement, laser settings could be easily optimized to ensure proper fuse opening.

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