Thin film and emissivity effects on radiometric temperature measurement accuracy

Author(s):  
J. Bodycomb ◽  
P. Helm ◽  
M. Kane ◽  
D. Nicol ◽  
I. Ferguson
2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Arkadiusz P. Gertych ◽  
Anna Łapińska ◽  
Karolina Czerniak-Łosiewicz ◽  
Anna Dużyńska ◽  
Mariusz Zdrojek ◽  
...  

Abstract A deep understanding of the thermal properties of 2D materials is crucial to their implementation in electronic and optoelectronic devices. In this study, we investigated the macroscopic in-plane thermal conductivity (κ) and thermal interface conductance (g) of large-area (mm2) thin film made from MoS2 nanoflakes via liquid exfoliation and deposited on Si/SiO2 substrate. We found κ and g to be 1.5 W/mK and 0.23 MW/m2K, respectively. These values are much lower than those of single flakes. This difference shows the effects of interconnections between individual flakes on macroscopic thin film parameters. The properties of a Gaussian laser beam and statistical optothermal Raman mapping were used to obtain sample parameters and significantly improve measurement accuracy. This work demonstrates how to address crucial stability issues in light-sensitive materials and can be used to understand heat management in MoS2 and other 2D flake-based thin films.


2016 ◽  
Vol 52 (13) ◽  
pp. 1140-1141 ◽  
Author(s):  
WenLian Wang ◽  
Hui Zhang ◽  
XiaoJun Du ◽  
YouYi Sun

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