An Investigation of the Accuracy of the VPR and COFFE Area Models in Predicting the Layout Area of FPGA Lookup Tables

Author(s):  
Mousa Al-Qawasmi ◽  
Andy G. Ye
Keyword(s):  
2021 ◽  
Author(s):  
Mousa Al-Qawasmi

A single tile in a mesh-based FPGA includes both the routing block and the logic block. The area estimate of a tile in an FPGA is used to determine the physical length of an FPGA’s routing segments. An estimate of the physical length of the routing segments is needed in order to accurately assess the performance of a proposed FPGA architecture. The VPR (Versatile Place and Route) and the COFFE (Circuit Optimization for FPGA Exploration) tools are widely used meshbased FPGA exploration environments. These tools map, place, and route benchmark circuits on FPGA architectures. Subsequently, based on area and delay measurements, the best architectural parameters of an FPGA are decided. The area models of the VPR and COFEE tools take only transistor size as input to estimate the area of a circuit. Realistically, the layout area of a circuit depends on both the transistor size and the number of metal layers that are available to route the circuit. This work measures the effect of the number of metal layers that are available for routing on FPGA layout area through a series of carefully laid out 4-LUTs (4-input Lookup Tables). Based on measured results, a correction factor for the COFFE area equation is determined. The correction factor is a function of both the transistor drive strength and the number of metal layers that are available for routing. Consequently, a new area estimation equation, that is based on the COFFE area model, is determined. The proposed area equation takes into consideration the effect of both the transistor drive strength and the number of metal layers that are available for routing on layout area. The area prediction error of the proposed area equation is significantly less than the area prediction errors of the VPR and COFFE area models.


2021 ◽  
Author(s):  
Mousa Al-Qawasmi

A single tile in a mesh-based FPGA includes both the routing block and the logic block. The area estimate of a tile in an FPGA is used to determine the physical length of an FPGA’s routing segments. An estimate of the physical length of the routing segments is needed in order to accurately assess the performance of a proposed FPGA architecture. The VPR (Versatile Place and Route) and the COFFE (Circuit Optimization for FPGA Exploration) tools are widely used meshbased FPGA exploration environments. These tools map, place, and route benchmark circuits on FPGA architectures. Subsequently, based on area and delay measurements, the best architectural parameters of an FPGA are decided. The area models of the VPR and COFEE tools take only transistor size as input to estimate the area of a circuit. Realistically, the layout area of a circuit depends on both the transistor size and the number of metal layers that are available to route the circuit. This work measures the effect of the number of metal layers that are available for routing on FPGA layout area through a series of carefully laid out 4-LUTs (4-input Lookup Tables). Based on measured results, a correction factor for the COFFE area equation is determined. The correction factor is a function of both the transistor drive strength and the number of metal layers that are available for routing. Consequently, a new area estimation equation, that is based on the COFFE area model, is determined. The proposed area equation takes into consideration the effect of both the transistor drive strength and the number of metal layers that are available for routing on layout area. The area prediction error of the proposed area equation is significantly less than the area prediction errors of the VPR and COFFE area models.


2016 ◽  
Vol 2016 (7) ◽  
pp. 1-6
Author(s):  
Sergey Makov ◽  
Vladimir Frantc ◽  
Viacheslav Voronin ◽  
Igor Shrayfel ◽  
Vadim Dubovskov ◽  
...  

2020 ◽  
Vol 11 (1) ◽  
pp. 129
Author(s):  
Po-Yu Kuo ◽  
Ming-Hwa Sheu ◽  
Chang-Ming Tsai ◽  
Ming-Yan Tsai ◽  
Jin-Fa Lin

The conventional shift register consists of master and slave (MS) latches with each latch receiving the data from the previous stage. Therefore, the same data are stored in two latches separately. It leads to consuming more electrical power and occupying more layout area, which is not satisfactory to most circuit designers. To solve this issue, a novel cross-latch shift register (CLSR) scheme is proposed. It significantly reduced the number of transistors needed for a 256-bit shifter register by 48.33% as compared with the conventional MS latch design. To further verify its functions, this CLSR was implemented by using TSMC 40 nm CMOS process standard technology. The simulation results reveal that the proposed CLSR reduced the average power consumption by 36%, cut the leakage power by 60.53%, and eliminated layout area by 34.76% at a supply voltage of 0.9 V with an operating frequency of 250 MHz, as compared with the MS latch.


VLSI Design ◽  
2015 ◽  
Vol 2015 ◽  
pp. 1-7 ◽  
Author(s):  
Xiao Wang ◽  
Zelin Shi

Being an essential part of infrared readout integrated circuit, correlated double sampling (CDS) circuits play important roles in both depressing reset noise and conditioning integration signals. To adapt applications for focal planes of large format and high density, a new structure of CDS circuit occupying small layout area is proposed, whose power dissipation has been optimized by using MOSFETs in operation of subthreshold region, which leads to 720 nW. Then the noise calculation model is established, based on which the noise analysis has been carried out by the approaches of transfer function and numerical simulations using SIMULINK and Verilog-A. The results are in good agreement, demonstrating the validity of the present noise calculation model. Thermal noise plays a dominant role in the long wave situation while 1/f noise is the majority in the medium wave situation. The total noise of long wave is smaller than medium wave, both of which increase with the integration capacitor and integration time increasing.


Author(s):  
Marcel Keller ◽  
Emmanuela Orsini ◽  
Dragos Rotaru ◽  
Peter Scholl ◽  
Eduardo Soria-Vazquez ◽  
...  
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