Interactions Between Line Edge Roughness and Random Dopant Fluctuation in Nonplanar Field-Effect Transistor Variability
2013 ◽
Vol 60
(10)
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pp. 3277-3284
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2017 ◽
Vol 17
(11)
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pp. 8338-8343
2019 ◽
Vol 35
(1)
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pp. 015004
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Keyword(s):
Keyword(s):
2011 ◽
Vol 50
(4)
◽
pp. 04DC07
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2011 ◽
Vol 50
(4S)
◽
pp. 04DC07
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Keyword(s):
2019 ◽
Vol 139
(3)
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pp. 207-210