An Analytical Drain Current Model for the Cylindrical Channel Gate-All-Around Heterojunction Tunnel FETs

2019 ◽  
Vol 66 (8) ◽  
pp. 3646-3651 ◽  
Author(s):  
Danial Keighobadi ◽  
Saeed Mohammadi ◽  
Morteza Fathipour
2017 ◽  
Vol 64 (8) ◽  
pp. 3502-3507 ◽  
Author(s):  
In Huh ◽  
Sangchun Park ◽  
Mincheol Shin ◽  
Woo Young Choi

2019 ◽  
Vol 9 (2) ◽  
pp. 291-297
Author(s):  
Hind Jaafar ◽  
Abdellah Aouaj ◽  
Ahmed Bouziane ◽  
Benjamin Iñiguez

Background: A novel Dual Material Gate Graded Channel and Dual Oxide Thickness Cylindrical Gate (DMG-GC-DOT) MOSFET is presented in this paper. Methods: Analytical model of drain current is developed using a quasi-two-dimensional cylindrical form of the Poisson equation and is expressed as a function of the surface potential, which is calculated using the expressions of the current density. Results: Comparison of the analytical results with 3D numerical simulations using Silvaco Atlas - TCAD software presents a good agreement from subthreshold to strong inversion regime and for different bias voltages. Conclusion: Two oxide thicknesses with different permittivity can effectively improve the subthreshold current of DMG-GC-DOT MOSFET.


Sign in / Sign up

Export Citation Format

Share Document