Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation—Part II
2019 ◽
Vol 66
(10)
◽
pp. 4243-4250
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1995 ◽
Vol 35
(3)
◽
pp. 603-608
◽
Keyword(s):
2019 ◽
Vol 66
(10)
◽
pp. 4235-4242
◽
2008 ◽
Vol 55
(6)
◽
pp. 3388-3393
◽
Keyword(s):
Keyword(s):
Keyword(s):