Modeling the Current–Voltage Characteristics of Ge₁₋ₓSnₓ Electron–Hole Bilayer TFET With Various Compositions

2020 ◽  
Vol 67 (7) ◽  
pp. 2738-2744
Author(s):  
Piotr Wisniewski ◽  
Bogdan Majkusiak
2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Yue-Min Wan ◽  
Heng-Tien Lin

AbstractStudy on single electron tunnel using current-voltage characteristics in nanopillar transistors at 298 K show that the mapping between the Nth electron excited in the central box ∼8.5 × 8.5 × 3 nm3 and the Nth tunnel peak is not in the one-to-one correspondence to suggest that the total number N of electrons is not the best quantum number for characterizing the quality of single electron tunnel in a three-dimensional quantum box transistor. Instead, we find that the best number is the sub-quantum number nz of the conduction z channel. When the number of electrons in nz is charged to be even and the number of electrons excited in the nx and ny are also even at two, the adding of the third electron into the easy nx/ny channels creates a weak symmetry breaking in the parity conserved x-y plane to assist the indirect tunnel of electrons. A comprehensive model that incorporates the interactions of electron-electron, spin-spin, electron-phonon, and electron-hole is proposed to explain how the excited even electrons can be stabilized in the electric-field driving channel. Quantum selection rules with hierarchy for the ni (i = x, y, z) and N = Σni are tabulated to prove the superiority of nz over N.


2018 ◽  
Vol 73 (11) ◽  
pp. 1047-1052
Author(s):  
Nesrine Mendil ◽  
Mebarka Daoudi ◽  
Zakarya Berkai ◽  
Abderrahmane Belghachi

AbstractStructural arrangement and construction are the keys to electron/hole motion through organic semiconductor lattices. In this work, we focused on the disorder energy, temperature, and electric field effects on charge carrier mobilities using a Poole–Frenkel mobility model for SubPc/C60 devices. The results agree with those found in the literature. We observed important temperature, applied voltage, and disorder energy dependencies of the current-voltage characteristics and charge carrier mobilities; these characteristics have the Gunn curve form called negative conductivity, which has been reported in amorphous semiconductors.


2020 ◽  
Vol 96 (3s) ◽  
pp. 291-294
Author(s):  
К.О. Петросянц ◽  
А.А. Пугачёв ◽  
И.А. Харитонов

Представлена TCAD-модель кремниевого бета-вольтаического элемента для исследования зависимости характеристик элемента от его объемной структуры. Для имитации результатов генерации электронно-дырочных пар при воздействии излучения от источника бета-частиц применялась настроенная модель оптической генерации, имеющаяся в TCAD. Проведено исследование зависимости вольт-амперных характеристик бета-вольтаического элемента от профиля легирующей примеси, температуры и типа полупроводникового материала для источника излучения Ni-63. The paper presents TCAD-silicon betavoltaic element model for studying cell characteristics depending on its two- and three-dimensional structures. To simulate the results of electron-hole pairs generation under exposure to radiation from the source of beta particles the tuned optical generation model, available in TCAD has been used. The authors have researched dependencies of the current-voltage characteristics of the betavoltaic element on structure doping profile, temperature and type of semiconductor material for Ni-63 radiation source.


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