Machine Learning Aided Device Simulation of Work Function Fluctuation for Multichannel Gate-All-Around Silicon Nanosheet MOSFETs

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3084910 ◽

2021 ◽

pp. 1-8

Author(s):

Chandni Akbar ◽

Yiming Li ◽

Wen Li Sung

Keyword(s):

Machine Learning ◽

Work Function ◽

Device Simulation ◽

Function Fluctuation

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Machine Learning Based Device Simulation Using Multi-variable Non-linear Regression to Assess the Impact of Device Parameter Variability on Threshold Voltage of Double Gate-All-Around (DGAA) MOSFET

2020 IEEE 2nd International Conference on Circuits and Systems (ICCS) ◽

10.1109/iccs51219.2020.9336608 ◽

2020 ◽

Author(s):

Sandeep Moparthi ◽

Chandan Yadav ◽

Gopi Krishna Saramekala ◽

Pramod Kumar Tiwari

Keyword(s):

Machine Learning ◽

Linear Regression ◽

Threshold Voltage ◽

Device Simulation ◽

Double Gate ◽

Device Parameter ◽

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Prediction of the Electronic Work Function by Regression Algorithm in Machine Learning

2021 IEEE 6th International Conference on Big Data Analytics (ICBDA) ◽

10.1109/icbda51983.2021.9403202 ◽

2021 ◽

Author(s):

Na Li ◽

Tianxin Zong ◽

Zhigang Zhang

Keyword(s):

Machine Learning ◽

Work Function ◽

Electronic Work Function

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SET response of FinFET-based majority voter circuits under work-function fluctuation

2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS) ◽

10.1109/icecs.2017.8292064 ◽

2017 ◽

Author(s):

Y. Q. Aguiar ◽

F. L. Kastensmidt ◽

C. Meinhardt ◽

R. A. L. Reis

Keyword(s):

Work Function ◽

Majority Voter ◽

Function Fluctuation

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A unified 3D device simulation of random dopant, interface trap and work function fluctuations on high-к/metal gate device

2011 International Electron Devices Meeting ◽

10.1109/iedm.2011.6131495 ◽

2011 ◽

Author(s):

Yiming Li ◽

Hui-Wen Cheng ◽

Yung-Yueh Chiu ◽

Chun-Yen Yiu ◽

Hsin-Wen Su

Keyword(s):

Work Function ◽

Device Simulation ◽

Interface Trap ◽

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Large-scale statistical simulation of characteristic variation in 16-nm-gate Bulk FinFET devices due to work function fluctuation

The 4th IEEE International NanoElectronics Conference ◽

10.1109/inec.2011.5991780 ◽

2011 ◽

Author(s):

Chun-Yen Yiu ◽

Hui-Wen Cheng ◽

Hsin-Wen Su ◽

Yiming Li

Keyword(s):

Work Function ◽

Large Scale ◽

Statistical Simulation ◽

Characteristic Variation ◽

Function Fluctuation

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A Nanosized-Metal-Grain Pattern-Dependent Threshold Voltage Model for the Work Function Fluctuation of GAA Si NW MOSFETs

IEEE Access ◽

10.1109/access.2021.3137851 ◽

2021 ◽

pp. 1-1

Author(s):

Wen Li Sung ◽

Yiming Li

Keyword(s):

Work Function ◽

Threshold Voltage ◽

Threshold Voltage Model ◽

Function Fluctuation

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Comparison of Voronoi and Cuboid Methods for Work Function Fluctuation and Suppression by Using Stacked-metal Gate on Gate-All-Around Nanowire n-MOSFETs

10.7567/ssdm.2019.ps-1-22 ◽

2019 ◽

Author(s):

Y.-S. Yang ◽

W.-L. Sung ◽

M.-H. Chuang ◽

Y. Li

Keyword(s):

Work Function ◽

Function Fluctuation

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Impact of work function of back contact of perovskite solar cells without hole transport material analyzed by device simulation

Current Applied Physics ◽

10.1016/j.cap.2014.08.002 ◽

2014 ◽

Vol 14 (11) ◽

pp. 1428-1433 ◽

Author(s):

Takashi Minemoto ◽

Masashi Murata

Keyword(s):

Solar Cells ◽

Work Function ◽

Perovskite Solar Cells ◽

Device Simulation ◽

Hole Transport ◽

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Statistical simulation of metal-gate work-function fluctuation in high-κ/metal-gate devices

2010 International Conference on Simulation of Semiconductor Processes and Devices ◽

10.1109/sispad.2010.5604544 ◽

2010 ◽

Author(s):

Chia-Hui Yu ◽

Ming-Hung Han ◽

Hui-Wen Cheng ◽

Zhong-Cheng Su ◽

Yiming Li ◽

...

Keyword(s):

Work Function ◽

Statistical Simulation ◽

Gate Work Function ◽

Function Fluctuation

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Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies

IEEE Transactions on Electron Devices ◽

10.1109/ted.2009.2036309 ◽

2010 ◽

Vol 57 (2) ◽

pp. 437-447 ◽

Author(s):

Yiming Li ◽

Chih-Hong Hwang ◽

Tien-Yeh Li ◽

Ming-Hung Han

Keyword(s):

Work Function ◽

Process Variation ◽

Random Dopant Fluctuation ◽

Gate Work Function ◽

Function Fluctuation ◽

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