Crystal Orientation, Order Degree, and Surface Roughness of FePd-Alloy Film Formed on MgO(001) Substrate

ABSTRACTUltrathin films of perovskite PbTiO3, 10–100nm thick, were epitaxially grown on miscut (001)SrTiO3 substrate by rf-magnetron sputtering at 600°C. The electron microscope and high resolution x-ray diffraction analysis suggested the evidence of epitaxial growth of (001)PbTiO3/(001)SrTiO3 with three dimensional crystal orientation. The stoichiometric film shows extremely smooth surface with the surface roughness less than 3nm. Deposition on a miscut substrate under stoichiometric conditions is essential to make continuous thin films of single crystal perovskite PbTiO3.

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Effects of Electrolysis and Bath Conditions on the Surface Roughness, Morphologyand Crystal Orientation of Zinc Electrodeposit

Tetsu-to-Hagane ◽

10.2355/tetsutohagane1955.76.8_1301 ◽

1990 ◽

Vol 76 (8) ◽

pp. 1301-1308 ◽

Cited By ~ 28

Author(s):

Masaru SAGIYAMA ◽

Masaki KAWABE ◽

Tsutomu WATANABE

Keyword(s):

Surface Roughness ◽

Crystal Orientation

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Study on the Surface Roughness and Crystal Orientation Effects on the Cross Slip under Pure Shear State

The Proceedings of Conference of Hokkaido Branch ◽

10.1299/jsmehokkaido.2002.42.200 ◽

2002 ◽

Vol 2002.42 (0) ◽

pp. 200-201

Author(s):

Shi hua TANG ◽

Michiaki KOBAYASHI ◽

Setsuo MIURA ◽

Hiroyuki FUJIKI ◽

Seiichi OMORI

Keyword(s):

Surface Roughness ◽

Crystal Orientation ◽

Pure Shear ◽

Cross Slip ◽

Orientation Effects ◽

The Cross ◽

Shear State

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Surface Morphology, Crystal Orientation and Scratch Properties of Au/NiCr/Ta Multi-Layered Metallic Films

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.353-358.1863 ◽

2007 ◽

Vol 353-358 ◽

pp. 1863-1866

Author(s):

Wu Tang ◽

Long Jiang Deng ◽

Ke Wei Xu ◽

Jian Lu

Keyword(s):

Surface Roughness ◽

Surface Morphology ◽

Substrate Temperature ◽

Crystal Orientation ◽

Scratch Test ◽

Test Method ◽

Metallic Films ◽

Force Microscopy ◽

Atomic Force ◽

Friction Mode

The crystal orientation, surface morphology, surface roughness and scratch properties of Au/NiCr/Ta multi-layered metallic films was examined by X-ray diffraction (XRD), atomic force microscopy (AFM) and a scratch test method, respectively. It was clarified that the surface morphology and surface roughness depend on the substrate temperature. The surface roughness decreases from 4.259nm to 2.935nm when substrate temperature changed from 100°C to 180°C, and then increases when substrate temperature above 180°C. The XRD revealed that there are only Au diffraction peaks with highly textured having a Au-(111) or a mixture of Au-(111) and Au-(200) orientation. The micro-scratch test reveals that both modes can be used for conventionally critical load determination, but the friction mode can additionally reflect the changes at different metallic film layers, the critical characteristic load was not sensitive to substrate temperature.

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