Effect of Oxidation-Induced Tensile Strain on Gate-All-Around Silicon-Nanowire-Based Single-Electron Transistor Fabricated Using Deep-UV Lithography
2011 ◽
Vol 10
(6)
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pp. 1214-1216
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Keyword(s):
2002 ◽
Vol 20
(6)
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pp. 2824
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2012 ◽
Vol 12
(3)
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pp. 2509-2512
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Keyword(s):
2016 ◽
Vol 739
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pp. 012048
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