Technology Scaling Trend of Soft Error Rate in Flip-Flops in $1\times$ nm Bulk FinFET Technology

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2018.2833875 ◽

2018 ◽

Vol 65 (6) ◽

pp. 1255-1263 ◽

Author(s):

Taiki Uemura ◽

Soonyoung Lee ◽

Udit Monga ◽

Jaehee Choi ◽

Seungbae Lee ◽

...

Keyword(s):

Technology Scaling ◽

Soft Error Rate

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Impact of CMOS technology scaling on the atmospheric neutron soft error rate

IEEE Transactions on Nuclear Science ◽

10.1109/23.903813 ◽

2000 ◽

Vol 47 (6) ◽

pp. 2586-2594 ◽

Author(s):

P. Hazucha ◽

C. Svensson

Keyword(s):

Cmos Technology ◽

Technology Scaling ◽

Soft Error Rate

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The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175845 ◽

2003 ◽

Author(s):

R. Baumann

Keyword(s):

Error Correction ◽

Rate Performance ◽

Technology Scaling ◽

Soft Error Rate ◽

Impact Of Technology ◽

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Impact of technology scaling on the combinational logic soft error rate

2014 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2014.6861093 ◽

2014 ◽

Author(s):

N. N. Mahatme ◽

N. J. Gaspard ◽

T. Assis ◽

S. Jagannathan ◽

I. Chatterjee ◽

...

Keyword(s):

Combinational Logic ◽

Technology Scaling ◽

Soft Error Rate ◽

Impact Of Technology

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High-accuracy estimation of soft error rate using PHYSERD with circuit simulation

2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ◽

10.1109/sispad.2014.6931634 ◽

2014 ◽

Author(s):

Takashi Kato ◽

Taiki Uemura ◽

Hideya Matsuyama

Keyword(s):

Circuit Simulation ◽

High Accuracy ◽

Accuracy Estimation ◽

Soft Error Rate

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CLEAR: A Cross-Layer Soft Error Rate Reduction method based on mitigating DETs in nanoscale combinational logics

Microprocessors and Microsystems ◽

10.1016/j.micpro.2021.104282 ◽

2021 ◽

pp. 104282

Author(s):

Amir M. Hajisadeghi ◽

Hamid R. Zarandi

Keyword(s):

Reduction Method ◽

Cross Layer ◽

Rate Reduction ◽

Soft Error Rate

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Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131359 ◽

2011 ◽

Author(s):

S. Martinie ◽

J.L. Autran ◽

S. Sauze ◽

D. Munteanu ◽

S. Uznanski ◽

...

Keyword(s):

Alpha Particle ◽

Soft Error Rate

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Cosmic ray induced soft error rate in VLSI circuits

IEEE Electron Device Letters ◽

10.1109/edl.1983.25694 ◽

1983 ◽

Vol 4 (6) ◽

pp. 172-174 ◽

Author(s):

G.A. Sai-Halasz

Keyword(s):

Vlsi Circuits ◽

Soft Error Rate

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Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET

2021 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps46558.2021.9405216 ◽

2021 ◽

Author(s):

B. Narasimham ◽

V. Chaudhary ◽

M. Smith ◽

L. Tsau ◽

D. Ball ◽

...

Keyword(s):

Soft Error Rate

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Neutron-induced soft error rate measurements in semiconductor memories

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2007.04.049 ◽

2007 ◽

Vol 579 (1) ◽

pp. 252-255 ◽

Author(s):

Kenan Ünlü ◽

Vijaykrishnan Narayanan ◽

Sacit M. Çetiner ◽

Vijay Degalahal ◽

Mary J. Irwin

Keyword(s):

Soft Error Rate

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A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936268 ◽

2017 ◽

Author(s):

N. N. Mahatme ◽

B. Min ◽

K. Loiko

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Body Bias ◽

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