Towards simultaneous delay-fault built-in self-test and partial-scan insertion

2002 ◽  
Author(s):  
G. Parthasarathy ◽  
M.L. Bushnell
Keyword(s):  
Delay Fault ◽  
Partial Scan ◽  
Self Test ◽  
Built In Self Test

Integration of partial scan and built-in self-test

1995 ◽  
Vol 7 (1-2) ◽  
pp. 125-137 ◽  
Author(s):  
Chih-Jen Lin ◽  
Yervant Zorian ◽  
Sudipta Bhawmik
Keyword(s):  
Partial Scan ◽  
Self Test ◽  
Built In Self Test

An efficient built-in self test method for robust path delay fault testing

1996 ◽  
Vol 8 (2) ◽  
pp. 219-222 ◽  
Author(s):  
Ioannis Voyiatzis ◽  
Antonis Paschalis ◽  
Dimitrios Nikolos ◽  
Constantin Halatsis
Keyword(s):  
Test Method ◽  
Path Delay ◽  
Fault Testing ◽  
Delay Fault ◽  
Delay Fault Testing ◽  
Path Delay Fault ◽  
Self Test ◽  
Path Delay Fault Testing ◽  
Built In Self Test

RF Phase Error Built-In-Self-Test for A GSM SOC

2008 ◽  
Vol 1 (4) ◽  
pp. 39-44
Author(s):  
Dallas Webster ◽  
Loi Phan ◽  
Oren Eliezer ◽  
Rick Hudgens ◽  
Donald Lie
Keyword(s):  
Phase Error ◽  
Self Test ◽  
Built In Self Test

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops

2021 ◽  
Vol 26 (3) ◽  
pp. 1-18
Author(s):  
Mehmet Ince ◽  
Ender Yilmaz ◽  
Wei Fu ◽  
Joonsung Park ◽  
Krishnaswamy Nagaraj ◽  
...  
Keyword(s):  
Phase Locked Loops ◽  
Test And Evaluation ◽  
Self Test ◽  
Built In Self Test
Sign in / Sign up

Export Citation Format

Share Document