A versatile built-in self test scheme for delay fault testing

Author(s):  
Y. Tsiatouhas ◽  
Th. Haniotakis ◽  
D. Nikolos ◽  
A. Arapoyanni
1996 ◽  
Vol 8 (2) ◽  
pp. 219-222 ◽  
Author(s):  
Ioannis Voyiatzis ◽  
Antonis Paschalis ◽  
Dimitrios Nikolos ◽  
Constantin Halatsis

2016 ◽  
Vol E99.C (10) ◽  
pp. 1219-1225
Author(s):  
Masahiro ISHIDA ◽  
Toru NAKURA ◽  
Takashi KUSAKA ◽  
Satoshi KOMATSU ◽  
Kunihiro ASADA

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