Thermal Gradient in Solder Joints Under Electrical Current Stressing

Author(s):  
Da-Jeng Yao ◽  
Chung-Yi Hsu ◽  
Chih Chen ◽  
Sheng-Hsiang Chiu

Thermal gradient phenomena in SnAg3.5 solder joints under high current density operating were both acquired from whole device simulation and observed from experiments. A series of structural solder bump models were created and simulated by finite element software under different current density. The thermal gradient and temperature increasing were investigated under current stressing of 103 A/cm2 to 104 A/cm2 at 70°C by infrared microscopy. The magnitude of the thermal gradient is increased by increasing the applied current. The measured temperature increase due to Joule heating is as high as 55.9°C, and the thermal gradient reached 333°C/cm when stressed by 104 A/cm2, yet only 8.3°C temperature increased and the thermal gradient reached 83°C/cm when stressed by 103 A/cm2. The temperature increasing in this model is 53.1°C and thermal gradient in the solder is 168°C/cm under 104 A/cm2 current stressing, yet only 10.4°C temperature increased and thermal gradient decreased to 35°C/cm under 103 A/cm2. After verification, only less than 0.5% error is achieved between simulation results and experiment results. It proves this built model can be used to project thermal characteristic of different module designs.

2013 ◽  
Vol 634-638 ◽  
pp. 2800-2803 ◽  
Author(s):  
Li Meng Yin ◽  
Yan Fei Geng ◽  
Zhang Liang Xu ◽  
Song Wei

Adopting an accurate micro-tensile method based on dynamic mechanical analyzer (DMA) instrument, the tensile strength of three kinds of copper-wire/solder/copper-wire sandwich structured microscale lead-free solder joints that underwent current stressing with a direct current density of 1.0×104 A/cm2 and loading time of 48 hours were investigated, and compared with those solder joints isothermal aged at 100 0C for 48 hours and as-reflowed condition. These three kinds of microscale columnar solder joints have different volumes, i.e., a same diameter of 300 μm but different heights of 100 μm, 200 μm and 300 μm. Experimental results show that both current stressing and isothermal aging degrades the tensile strength of microscale solder joints, and the solder joint with smaller volume obtains higher tensile strength under same test condition. In addition, current stressing induces obvious electromigration (EM) issue under high current density of 1.0×104 A/cm2, resulting in the decreasing of tensile strength and different fracture position, mode and surface morphology of microscale solder joints. The degree of strength degradation increases with the increasing of joint height when keep joint diameter constant, this is mainly due to that electromigration leads to voids form and grow at the interface of cathode, and solder joints with larger volume may contains more soldering defects as well.


2004 ◽  
Vol 33 (11) ◽  
pp. 1350-1354 ◽  
Author(s):  
T. L. Shao ◽  
S. H. Chiu ◽  
Chih Chen ◽  
D. J. Yao ◽  
C. Y. Hsu

2012 ◽  
Vol 48 (6) ◽  
pp. 2318-2325 ◽  
Author(s):  
Yong Zuo ◽  
Limin Ma ◽  
Sihan Liu ◽  
Ting Wang ◽  
Fu Guo ◽  
...  

2018 ◽  
Vol 30 (2) ◽  
pp. 74-80 ◽  
Author(s):  
Attila Geczy ◽  
Daniel Straubinger ◽  
Andras Kovacs ◽  
Oliver Krammer ◽  
Pavel Mach ◽  
...  

2017 ◽  
Vol 5 (3) ◽  
Author(s):  
Marzyeh Moradi ◽  
Man-Kwan Ng ◽  
Taekyung Lee ◽  
Jian Cao ◽  
Yoosuf N. Picard

Interface characteristics of Al/Cu microlaminates fabricated by an electrically assisted roll bonding (EARB) process were studied to understand the underlying physical/chemical phenomena that lead to bond strength enhancement when applying electrical current during deformation. Peel tests were conducted for the Al/Cu roll-bonded laminates produced under 0 A, 50 A, and 150 A applied current. After peel tests using a microtensile machine, the fractured surfaces of both the Al and Cu–sides were examined using scanning electron microscopy (SEM) for fractography and SEM-based energy dispersive (EDS) analysis. Results revealed the strong dependence of the fracture path and its morphology on the strength of the bond, which is influenced by various phenomena occurring at the interface during EARB, such as microextrusion through surface microcracks, possible formation of intermetallic components and thermal softening during simultaneous application of strain and high current density.


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