Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O2+ bombardment of organic materials

Ultimate resolution in the scanning electron microscope is determined not only by the diameter of the incident electron beam, but by interaction of that beam with the specimen material. Generally, while minimum beam diameter diminishes with increasing voltage, due to the reduced effect of aberration component and magnetic interference, the excited volume within the sample increases with electron energy. Thus, for any given material and imaging signal, there is an optimum volt age to achieve best resolution.In the case of organic materials, which are in general of low density and electric ally non-conducting; and may in addition be susceptible to radiation and heat damage, the selection of correct operating parameters is extremely critical and is achiev ed by interative adjustment.

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200kv superconducting cryo electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100127645 ◽

1987 ◽

Vol 45 ◽

pp. 642-643

Author(s):

M. Iwatsuki ◽

Y. Kokubo ◽

Y. Harada ◽

J. Lehman

Keyword(s):

Electron Microscope ◽

Structure Analysis ◽

Organic Materials ◽

Strong Interactions ◽

Specimen Preparation ◽

Great Effort ◽

Electron Microscopic ◽

Crystal Fields ◽

Special Skill ◽

Long Time

In recent years, the electron microscope has been significantly improved in resolution and we can obtain routinely atomic-level high resolution images without any special skill. With this improvement, the structure analysis of organic materials has become one of the interesting targets in the biological and polymer crystal fields.Up to now, X-ray structure analysis has been mainly used for such materials. With this method, however, great effort and a long time are required for specimen preparation because of the need for larger crystals. This method can analyze average crystal structure but is insufficient for interpreting it on the atomic or molecular level. The electron microscopic method for organic materials has not only the advantage of specimen preparation but also the capability of providing various information from extremely small specimen regions, using strong interactions between electrons and the substance. On the other hand, however, this strong interaction has a big disadvantage in high radiation damage.

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Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135149 ◽

1990 ◽

Vol 48 (2) ◽

pp. 308-309

Author(s):

Bruno Schueler ◽

Robert W. Odom

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Structural Information ◽

Time Of Flight ◽

Biological Tissues ◽

Polymer Surfaces ◽

Tof Sims ◽

Secondary Ions ◽

Ion Mass Spectrometry ◽

Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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Scanning ion microscopy images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010012583x ◽

1987 ◽

Vol 45 ◽

pp. 180-181

Author(s):

R. Levi-Setti ◽

J.M. Chabala ◽

Y.L. Wang

Keyword(s):

Metal Ion ◽

Secondary Emission ◽

Scanning Method ◽

Ion Channeling ◽

Secondary Ions ◽

High Resolution Images ◽

Ion Microscopy ◽

Z Contrast ◽

Focused Beams ◽

Microscopy Images

Finely focused beams extracted from liquid metal ion sources (LMIS) provide a wealth of secondary signals which can be exploited to create high resolution images by the scanning method. The images of scanning ion microscopy (SIM) encompass a variety of contrast mechanisms which we classify into two broad categories: a) Emission contrast and b) Analytical contrast.Emission contrast refers to those mechanisms inherent to the emission of secondaries by solids under ion bombardment. The contrast-carrying signals consist of ion-induced secondary electrons (ISE) and secondary ions (ISI). Both signals exhibit i) topographic emission contrast due to the existence of differential geometric emission and collection effects, ii) crystallographic emission contrast, due to primary ion channeling phenomena and differential oxidation of crystalline surfaces, iii) chemical emission or Z-contrast, related to the dependence of the secondary emission yields on the Z and surface chemical state of the target.

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STM of freeze-fracture replicas: Problems and promises

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100146187 ◽

1993 ◽

Vol 51 ◽

pp. 68-69

Author(s):

J. T. Woodward ◽

J. A. N. Zasadzinski

Keyword(s):

Scanning Tunneling Microscope ◽

Organic Materials ◽

Freeze Fracture ◽

Atomic Resolution ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Molecular Scale ◽

Organic Surfaces ◽

Metal Layers ◽

Conductive Surfaces

The Scanning Tunneling Microscope (STM) offers exciting new ways of imaging surfaces of biological or organic materials with resolution to the sub-molecular scale. Rigid, conductive surfaces can readily be imaged with the STM with atomic resolution. Unfortunately, organic surfaces are neither sufficiently conductive or rigid enough to be examined directly with the STM. At present, nonconductive surfaces can be examined in two ways: 1) Using the AFM, which measures the deflection of a weak spring as it is dragged across the surface, or 2) coating or replicating non-conductive surfaces with metal layers so as to make them conductive, then imaging with the STM. However, we have found that the conventional freeze-fracture technique, while extremely useful for imaging bulk organic materials with STM, must be modified considerably for optimal use in the STM.

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Stabilizing pyritic material

The Paleontological Society Special Publications ◽

10.1017/s2475262200005207 ◽

1989 ◽

Vol 4 ◽

pp. 244-248 ◽

Cited By ~ 2

Author(s):

Donald L. Wolberg

Keyword(s):

Significant Contribution ◽

Organic Materials ◽

Sedimentary Rocks ◽

Iron Sulfides ◽

Decomposition Products ◽

Iron Minerals ◽

Pyrite Formation ◽

Organic Sediments ◽

Freshwater Environments

The minerals pyrite and marcasite (broadly termed pyritic minerals) are iron sulfides that are common if not ubiquitous in sedimentary rocks, especially in association with organic materials (Berner, 1970). In most marine sedimentary associations, pyrite and marcasite are associated with organic sediments rich in dissolved sulfate and iron minerals. Because of the rapid consumption of sulfate in freshwater environments, however, pyrite formation is more restricted in nonmarine sediments (Berner, 1983). The origin of the sulfur in nonmarine environments must lie within pre-existing rocks or volcanic detritus; a relatively small, but significant contribution may derive from plant and animal decomposition products.

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