High fidelity in Auger spectroscopy: Dependence on experimental parameters

AbstractWe introduce a method for high-fidelity quantum state transduction between a superconducting microwave qubit and the ground state spin system of a solid-state artificial atom, mediated via an acoustic bus connected by piezoelectric transducers. Applied to present-day experimental parameters for superconducting circuit qubits and diamond silicon-vacancy centers in an optimized phononic cavity, we estimate quantum state transduction with fidelity exceeding 99% at a MHz-scale bandwidth. By combining the complementary strengths of superconducting circuit quantum computing and artificial atoms, the hybrid architecture provides high-fidelity qubit gates with long-lived quantum memory, high-fidelity measurement, large qubit number, reconfigurable qubit connectivity, and high-fidelity state and gate teleportation through optical quantum networks.

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The many faces of STEM in materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100086507 ◽

1991 ◽

Vol 49 ◽

pp. 440-441

Author(s):

John Silcox

Keyword(s):

Materials Science ◽

Auger Spectroscopy ◽

Dark Field ◽

High Tc Superconductors ◽

High Tc ◽

Acoustic Environment ◽

Electromagnetic Vibration ◽

The Many ◽

Serial Mode

Determination of the microstructure and microchemistry of small features often provides the insight needed for the understanding of processes in real materials. In many cases, it is not adequate to use microscopy alone. Microdiffraction and microspectroscopic information such as EELS, X-ray microprobe analysis and Auger spectroscopy can all contribute vital parts of the picture. For a number of reasons, dedicated STEM offers considerable promise as a quantitative instrument. In this paper, we review progress towards effective quantitative use of STEM with illustrations drawn from studies of high Tc superconductors, compound semiconductors and metallization of H-terminated silicon.Intrinsically, STEM is a quantitative instrument. Images are acquired directly by detectors in serial mode which is particularly convenient for digital image acquisition, control and display. The VG HB501A at Cornell has been installed in a particularly stable electromagnetic, vibration and acoustic environment. Care has been paid to achieving UHV conditions (i.e., 10-10 Torr). Finally, it has been interfaced with a VAX 3200 work station by Kirkland. This permits, for example, the acquisition of bright field (or energy loss) images and dark field images simultaneously as quantitative arrays in perfect registration.

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Design of a UHV STEM for Through-The-Lens Electron Spectroscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135502 ◽

1990 ◽

Vol 48 (2) ◽

pp. 380-381

Author(s):

A. J. Bleeker ◽

P. Kruit

Keyword(s):

Secondary Electron ◽

High Vacuum ◽

Secondary Electron Emission ◽

Auger Spectroscopy ◽

Scanning Transmission Electron Microscope ◽

Point Of View ◽

Ultra High Vacuum ◽

Scanning Transmission ◽

Auger Spectra ◽

Coincidence Measurements

Combining of the high spatial resolution of a Scanning Transmission Electron Microscope and the wealth of information from the secondary electrons and Auger spectra opens up new possibilities for materials research. In a prototype instrument at the Delft University of Technology we have shown that it is possible from the optical point of view to combine STEM and Auger spectroscopy [1]. With an Electron Energy Loss Spectrometer attached to the microscope it also became possible to perform coincidence measurements between the secondary electron signal and the EELS signal. We measured Auger spectra of carbon aluminium and Argon gas showing energy resolutions better than 1eV [2]. The coincidence measurements on carbon with a time resolution of 5 ns yielded basic insight in secondary electron emission processes [3]. However, for serious Auger spectroscopy, the specimen needs to be in Ultra High Vacuum. ( 10−10 Torr ). At this moment a new setup is in its last phase of construction.

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Using the Theory of Planned Behavior to Predict Faking in Selection Exercises Varying in Fidelity

Journal of Personnel Psychology ◽

10.1027/1866-5888/a000211 ◽

2018 ◽

Vol 17 (3) ◽

pp. 155-160 ◽

Cited By ~ 3

Author(s):

Daniel Dürr ◽

Ute-Christine Klehe

Keyword(s):

Theory Of Planned Behavior ◽

Planned Behavior ◽

Predictive Validity ◽

Group Discussion ◽

Role Play ◽

Selection Procedure ◽

High Fidelity ◽

Selection Research ◽

Play Group

Abstract. Faking has been a concern in selection research for many years. Many studies have examined faking in questionnaires while far less is known about faking in selection exercises with higher fidelity. This study applies the theory of planned behavior (TPB; Ajzen, 1991 ) to low- (interviews) and high-fidelity (role play, group discussion) exercises, testing whether the TPB predicts reported faking behavior. Data from a mock selection procedure suggests that candidates do report to fake in low- and high-fidelity exercises. Additionally, the TPB showed good predictive validity for faking in a low-fidelity exercise, yet not for faking in high-fidelity exercises.

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