Nanostructural characterization of thin‐film transistors using a combination of scanning force microscopy and transmission electron microscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580325 ◽

1996 ◽

Vol 14 (3) ◽

pp. 1714-1718 ◽

Author(s):

S. Tsuji ◽

T. Tsujimura ◽

K. Tsujimoto ◽

N. Tsutsui ◽

N. Miura ◽

...

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Thin Film Transistors ◽

Scanning Force Microscopy ◽

Force Microscopy ◽

Transmission Electron ◽

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Open‐core screw dislocations in GaN epilayers observed by scanning force microscopy and high‐resolution transmission electron microscopy

Applied Physics Letters ◽

10.1063/1.115127 ◽

1995 ◽

Vol 67 (16) ◽

pp. 2284-2286 ◽

Author(s):

W. Qian ◽

G. S. Rohrer ◽

M. Skowronski ◽

K. Doverspike ◽

L. B. Rowland ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Force Microscopy ◽

Screw Dislocations ◽

Force Microscopy ◽

Transmission Electron ◽

Scanning Force ◽

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Transmission electron microscopy and scanning force microscopy of poly r(A-U) and poly r(A-U)-ethidium bromide

Scanning ◽

10.1002/sca.4950190801 ◽

2006 ◽

Vol 19 (8) ◽

pp. 523-532 ◽

Author(s):

J. Gilloteaux ◽

J. M. Jamison ◽

F. Zenhausern ◽

M. Adrian ◽

J. L. Summers

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ethidium Bromide ◽

Scanning Force Microscopy ◽

Force Microscopy ◽

Transmission Electron ◽

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Cross-sectional characterization of thin-film transistors with transmission electron microscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587852 ◽

1995 ◽

Vol 13 (3) ◽

pp. 1353 ◽

Author(s):

S. Tsuji

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Thin Film Transistors ◽

Cross Sectional ◽

Transmission Electron

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Comparative study of a block copolymer morphology by transmission electron microscopy and scanning force microscopy

Journal of Microscopy ◽

10.1046/j.0022-2720.2001.00975.x ◽

2002 ◽

Vol 205 (1) ◽

pp. 106-108 ◽

Author(s):

H. Ott ◽

V. Abetz ◽

V. Altstädt ◽

Y. Thomann ◽

A. Pfau

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Block Copolymer ◽

Comparative Study ◽

Scanning Force Microscopy ◽

Force Microscopy ◽

Transmission Electron ◽

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Investigation on the surface orientation of cylindrical microdomains in styrene-butadiene-styrene triblock copolymers by scanning force microscopy/transmission electron microscopy

Macromolecular Rapid Communications ◽

10.1002/marc.1995.030161207 ◽

1995 ◽

Vol 16 (12) ◽

pp. 919-925 ◽

Author(s):

Ercole Gattiglia ◽

Antonio Turturro ◽

Davide Ricci ◽

Annalisa Bonfiglio

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Triblock Copolymers ◽

Scanning Force Microscopy ◽

Force Microscopy ◽

Transmission Electron ◽

Scanning Force ◽

Styrene Butadiene Styrene ◽

Styrene Butadiene ◽

Butadiene Styrene

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Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

Thin Solid Films ◽

10.1016/s0040-6090(98)00453-2 ◽

1998 ◽

Vol 321 (1-2) ◽

pp. 86-91 ◽

Author(s):

G Wöhl ◽

C Schöllhorn ◽

O.G Schmidt ◽

K Brunner ◽

K Eberl ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron ◽

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Characterization of a Ti64Ni20Pd16 thin film by transmission electron microscopy

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_258 ◽

2008 ◽

pp. 515-516

Author(s):

R. Zarnetta ◽

E. Zelaya ◽

G. Eggeler ◽

A. Ludwig

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron

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Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyanoquinodimethane thin film grown by vacuum evaporation

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1459723 ◽

2002 ◽

Vol 20 (2) ◽

pp. 673 ◽

Author(s):

J. C. Li ◽

W. M. Liu ◽

Z. Q. Xue

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Pattern Formation ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron

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Errata: “Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyano- quinodimethane thin film grown by vacuum evaporation” [J. Vac. Sci. Technol. B 20, 673 (2002)]

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1740769 ◽

2004 ◽

Vol 22 (3) ◽

pp. 1213

Author(s):

J. C. Li ◽

W. M. Liu ◽

Z. Q. Xue

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Pattern Formation ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron

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Transmission Electron Microscopy and Atomic Force Microscopy Studies of an Al–Pd–Mn Thin Film Prepared by a Combined Technique of Vacuum Deposition and Thermal Annealing

Japanese Journal of Applied Physics ◽

10.1143/jjap.40.4136 ◽

2001 ◽

Vol 40 (Part 1, No. 6A) ◽

pp. 4136-4140 ◽

Author(s):

Kaichi Saito ◽

Masakazu Yoneshima ◽

Shigeo Sugawara ◽

Yasushi Kamimura ◽

Keiichi Edagawa

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Thermal Annealing ◽

Vacuum Deposition ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron ◽

Combined Technique

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