Size effect study of thin film hardness using AFM nano-indentation

2015 ◽  
Author(s):  
Linyan Xu ◽  
Shuangbei Qian ◽  
Juan Li ◽  
Congcong Liu ◽  
Shijia Guo ◽  
...  
Structures ◽  
2021 ◽  
Vol 32 ◽  
pp. 2020-2031
Author(s):  
Guolong Zhang ◽  
Qingwen Zhang ◽  
Feng Fan ◽  
Shizhao Shen

2013 ◽  
Vol 2 (1) ◽  
pp. 11-19 ◽  
Author(s):  
Chengbo Zhang ◽  
Shihong Zhou ◽  
Keyan Li ◽  
Shuyan Song ◽  
Dongfeng Xue

2008 ◽  
Vol 33-37 ◽  
pp. 969-974 ◽  
Author(s):  
Bong Bu Jung ◽  
Seong Hyun Ko ◽  
Hun Kee Lee ◽  
Hyun Chul Park

This paper will discuss two different techniques to measure mechanical properties of thin film, bulge test and nano-indentation test. In the bulge test, uniform pressure applies to one side of thin film. Measurement of the membrane deflection as a function of the applied pressure allows one to determine the mechanical properties such as the elastic modulus and the residual stress. Nano-indentation measurements are accomplished by pushing the indenter tip into a sample and then withdrawing it, recording the force required as a function of position. . In this study, modified King’s model can be used to estimate the mechanical properties of the thin film in order to avoid the effect of substrates. Both techniques can be used to determine Young’s modulus or Poisson’s ratio, but in both cases knowledge of the other variables is needed. However, the mathematical relationship between the modulus and Poisson's ratio is different for the two experimental techniques. Hence, achieving agreement between the techniques means that the modulus and Poisson’s ratio and Young’s modulus of thin films can be determined with no a priori knowledge of either.


Author(s):  
Yu Hou ◽  
Haofeng Xie ◽  
Xujun Mi ◽  
Wenjing Zhang ◽  
Zhen Yang ◽  
...  

Nanoscale ◽  
2019 ◽  
Vol 11 (47) ◽  
pp. 22907-22923 ◽  
Author(s):  
Yang Li ◽  
Junchao Duan ◽  
Xiangyuan Chai ◽  
Man Yang ◽  
Ji Wang ◽  
...  

Silica nanoparticles produced size-dependent toxic effect on the gene expression profile of BEAS-2B cells.


1996 ◽  
Vol 352-354 ◽  
pp. 305-309 ◽  
Author(s):  
Václav Nehasil ◽  
Iva Stará ◽  
Vladimír Matolín

2011 ◽  
Vol 519 (10) ◽  
pp. 3221-3224 ◽  
Author(s):  
Seung Min Han ◽  
Eric P. Guyer ◽  
William D. Nix
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document