Characterization of non-conductive materials using field emission scanning electron microscopy

2016 ◽  
Author(s):  
Cong Cao ◽  
Ran Gao ◽  
Huayan Shang ◽  
Tingting Peng
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Field Emission ◽  
Conductive Materials ◽  
Scanning Electron

Characterization of coal before and after supercritical CO 2 exposure via feature relocation using field-emission scanning electron microscopy

Fuel ◽  
2013 ◽  
Vol 107 ◽  
pp. 777-786 ◽  
Author(s):  
Barbara G. Kutchko ◽  
Angela L. Goodman ◽  
Eilis Rosenbaum ◽  
Sittichai Natesakhawat ◽  
Keith Wagner
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Field Emission ◽  
Before And After ◽  
Scanning Electron

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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