3D-additive manufacturing non-destructive characterization with terahertz waves (Conference Presentation)

2018 ◽  
Author(s):  
Jean-Paul Guillet ◽  
Anne-Françoise Obaton ◽  
Jean Baptiste Perraud ◽  
Hugo Balacey ◽  
Benoit Recur ◽  
...  
Keyword(s):  
Additive Manufacturing ◽  
Terahertz Waves ◽  
Non Destructive ◽  
Non Destructive Characterization

scholarly journals Energy dispersive X-ray diffraction (EDXRD) for operando materials characterization within batteries

2020 ◽  
Vol 22 (37) ◽  
pp. 20972-20989 ◽  
Author(s):  
Amy C. Marschilok ◽  
Andrea M. Bruck ◽  
Alyson Abraham ◽  
Chavis A. Stackhouse ◽  
Kenneth J. Takeuchi ◽  
...  
Keyword(s):  
Materials Characterization ◽  
Energy Dispersive ◽  
System Level ◽  
X Ray Diffraction ◽  
X Ray ◽  
Non Destructive ◽  
Non Destructive Characterization

This review highlights the efficacy of EDXRD as a non-destructive characterization tool in elucidating system-level phenomena for batteries.

Non-Destructive Measurements of III-V Semiconductor Device Structure by a Hard X-ray Microprobe

1991 ◽  
Vol 240 ◽  
Author(s):  
F. Uchida ◽  
J. Shigeta ◽  
Y. SUZUKI
Keyword(s):  
Semiconductor Device ◽  
Film Structure ◽  
Device Structure ◽  
X Ray ◽  
Model Sample ◽  
Device Structures ◽  
The Difference ◽  
X Ray Absorption ◽  
Non Destructive ◽  
Non Destructive Characterization

ABSTRACTA non-destructive characterization technique featuring a hard X-ray Microprobe is demonstrated for lll-V semiconductor device structures. A GaAs FET with a 2 μm gate length is measured as a model sample of a thin film structure. X-ray scanning microscopic images of the FET are obtained by diffracted X-ray and fluorescence X-ray detection. Diffracted X-ray detection measures the difference in gate material and source or drain material as a gray level difference on the image due to the X-ray absorption ratio. Ni Ka fluorescence detection, on the other hand, provides imaging of 500 Å thick Ni layers, which are contained only in the source and drain metals, through non-destructive observation.

scholarly journals Investigation of new volumetric non-destructive techniques to characterise additive manufacturing parts

2018 ◽  
Vol 62 (5) ◽  
pp. 1049-1057 ◽  
Author(s):  
A-F. Obaton ◽  
M-Q. Lê ◽  
V. Prezza ◽  
D. Marlot ◽  
P. Delvart ◽  
...  
Keyword(s):  
Additive Manufacturing ◽  
Non Destructive ◽  
Non Destructive Techniques
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