Features of X-ray diffraction at elastic deformations near the dislocation axis in section topography techniques

2007 ◽  
Vol 1 (5) ◽  
pp. 498-512 ◽  
Author(s):  
E. V. Suvorov ◽  
I. A. Smirnova ◽  
E. V. Shulakov
Keyword(s):  
X Ray Diffraction ◽  
Elastic Deformations ◽  
X Ray ◽  
Section Topography

X-Ray Diffraction Microscopy of Planar Diffused Junction Structures

1966 ◽  
Vol 10 ◽  
pp. 118-133 ◽  
Author(s):  
J. K. Howard ◽  
G. H. Schwuttke
Keyword(s):  
Silicon Oxide ◽  
Wafer Surface ◽  
X Ray Diffraction ◽  
Diffraction Intensity ◽  
Elastic Deformations ◽  
X Ray ◽  
Silicon Devices ◽  
Planar Silicon ◽  
P Type ◽  
Processing Steps

AbstractBasic processing steps utilized in the fabrication of planar silicon devices include (a) substrate preparation, (b) epitaxial deposition, (c) thermal gvowth of silicon dioxide over the entire silicon wafer surface, (d) device pattern formation by photoetching techniques, and (e) diffusion of n-type or p-type elements through the holes to produce localized regions of desired conductivity, A detailed study of the various diffraction phenomena associated with such structures is presented. X-ray topographs of planar transistors show distinct contrast features such as excess diffraction intensity along the silicon oxide/silicon boundary and/or excess diffraction intensity inside the device area. The diffraction phenomena are discussed in terms of reversible elastic deformations, frozen-in lattice deformations, strain fields and imperfections generated by the various processing steps. A technique is presented to measure the sign of the elastic deformations. The phenomenon of stressjumping across semiconductors interfaces is described, and finally the implications of stress-strain relations on junction performance are stated.

Investigation by coherent X-ray section topography of ferroelectric domain behaviour as a function of temperature in periodically poled Rb:KTP

2011 ◽  
Vol 44 (3) ◽  
pp. 462-466 ◽  
Author(s):  
Fabio Masiello ◽  
Tamzin A. Lafford ◽  
Petra Pernot ◽  
José Baruchel ◽  
Dean S. Keeble ◽  
...  
Keyword(s):  
Curie Temperature ◽  
Ferroelectric Domain ◽  
Potassium Titanyl Phosphate ◽  
X Ray Diffraction ◽  
Periodically Poled ◽  
X Ray ◽  
Ferroelectric Domains ◽  
Diffraction Imaging ◽  
Section Topography

The behaviour of ferroelectric domains at high temperatures near the Curie temperature in a periodically poled rubidium-doped potassium titanyl phosphate crystal (Rb:KTP) has been studied by Bragg–Fresnel X-ray diffraction imagingin situusing a compact coherence-preserving furnace. The development and partial disappearance of the inverted domain structure as the temperature increases has been successfully modelled, and is explained by invoking a built-in electric field produced under heating in a low vacuum by out-diffusion of atoms from the sample.

Elastic deformations in hexagonal phases studied by small-angle X-ray diffraction and simulations

2011 ◽  
Vol 13 (8) ◽  
pp. 3100-3107 ◽  
Author(s):  
Šárka Perutková ◽  
Matej Daniel ◽  
Michael Rappolt ◽  
Georg Pabst ◽  
Gregor Dolinar ◽  
...  
Keyword(s):  
Small Angle ◽  
X Ray Diffraction ◽  
Elastic Deformations ◽  
X Ray

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Ribosome Structural Organization

1974 ◽  
Vol 32 ◽  
pp. 332-333
Author(s):  
James A. Lake
Keyword(s):  
Ribosomal Proteins ◽  
Structural Organization ◽  
Three Dimensional ◽  
Small Subunit ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
Specific Antibodies ◽  
X Ray ◽  
E Coli ◽  
Complete Sequences

The understanding of ribosome structure has advanced considerably in the last several years. Biochemists have characterized the constituent proteins and rRNA's of ribosomes. Complete sequences have been determined for some ribosomal proteins and specific antibodies have been prepared against all E. coli small subunit proteins. In addition, a number of naturally occuring systems of three dimensional ribosome crystals which are suitable for structural studies have been observed in eukaryotes. Although the crystals are, in general, too small for X-ray diffraction, their size is ideal for electron microscopy.

Electron Microscopy of Human Gallstones

1971 ◽  
Vol 29 ◽  
pp. 296-297
Author(s):  
C. Wolpers ◽  
R. Blaschke
Keyword(s):  
Electron Microscopy ◽  
Room Temperature ◽  
Bile Pigment ◽  
X Ray Diffraction ◽  
Triclinic Crystal System ◽  
X Ray ◽  
Follow Up Study ◽  
Infra Red ◽  
Main Components

Scanning microscopy was used to study the surface of human gallstones and the surface of fractures. The specimens were obtained by operation, washed with water, dried at room temperature and shadowcasted with carbon and aluminum. Most of the specimens belong to patients from a series of X-ray follow-up study, examined during the last twenty years. So it was possible to evaluate approximately the age of these gallstones and to get information on the intensity of growing and solving.Cholesterol, a group of bile pigment substances and different salts of calcium, are the main components of human gallstones. By X-ray diffraction technique, infra-red spectroscopy and by chemical analysis it was demonstrated that all three components can be found in any gallstone. In the presence of water cholesterol crystallizes in pane-like plates of the triclinic crystal system.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Electron Microscopy of Shock Loaded Polycrystalline Beryllium

1974 ◽  
Vol 32 ◽  
pp. 506-507 ◽  
Author(s):  
J. M. Galbraith ◽  
L. E. Murr ◽  
A. L. Stevens
Keyword(s):  
Electron Microscopy ◽  
Wave Propagation ◽  
Structural Change ◽  
Single Crystal ◽  
Diffraction Pattern ◽  
Shock Loading ◽  
Slip Systems ◽  
Compression Tests ◽  
X Ray Diffraction ◽  
X Ray

Uniaxial compression tests and hydrostatic tests at pressures up to 27 kbars have been performed to determine operating slip systems in single crystal and polycrystal1ine beryllium. A recent study has been made of wave propagation in single crystal beryllium by shock loading to selectively activate various slip systems, and this has been followed by a study of wave propagation and spallation in textured, polycrystal1ine beryllium. An alteration in the X-ray diffraction pattern has been noted after shock loading, but this alteration has not yet been correlated with any structural change occurring during shock loading of polycrystal1ine beryllium.This study is being conducted in an effort to characterize the effects of shock loading on textured, polycrystal1ine beryllium. Samples were fabricated from a billet of Kawecki-Berylco hot pressed HP-10 beryllium.

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