RTS NOISE DUE TO ELECTROSTATIC DISCHARGE (ESD) STRESS - INDUCED LOCALIZED DAMAGE IN THE CHANNEL OF GROUNDED-GATE NMOS ESD PROTECTION DEVICES
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1999 ◽
Vol 39
(6-7)
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pp. 1143-1148
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2005 ◽
Vol 52
(7)
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pp. 1484-1488
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Keyword(s):
2012 ◽
Vol 271-272
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pp. 1286-1290
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2013 ◽
Vol 706-708
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pp. 1720-1725
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2001 ◽
Vol 41
(9-10)
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pp. 1385-1390
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