Self-Stabilizing Algorithms for Tree Metrics

1998 ◽  
Vol 08 (01) ◽  
pp. 121-133
Author(s):  
Ajoy K. Datta ◽  
Teofilo F. Gonzalez ◽  
Visalakshi Thiagarajan
Keyword(s):  
Fault Tolerance ◽  
Finite Time ◽  
Initial System ◽  
Transient Faults ◽  
System Configuration ◽  
Tree Metrics ◽  
Self Stabilization

We present algorithms for finding the diameter, centroid(s), and median(s) for tree structured networks subject to transient faults. In our solutions, the system reaches its final correct configuration in a finite time after the faults cease. The fault-tolerance is achieved using Dijkstra's paradigm of self-stabilization. A self-stabilizing algorithm, regardless of the initial system configuration, converges, in finite time, to a set of legitimate configurations.

Self-Stabilizing Graph Coloring Algorithms

2013 ◽  
pp. 96-110
Author(s):  
Shing-Tsaan Huang ◽  
Chi-Hung Tzeng ◽  
Jehn-Ruey Jiang
Keyword(s):  
Distributed Computing ◽  
Graph Coloring ◽  
Finite Time ◽  
Planar Graphs ◽  
Edge Coloring ◽  
Vertex Coloring ◽  
Transient Faults ◽  
Initial State ◽  
Self Stabilization ◽  
Legitimate State

The concept of self-stabilization in distributed systems was introduced by Dijkstra in 1974. A system is said to be self-stabilizing if (1) it can converge in finite time to a legitimate state from any initial state, and (2) when it is in a legitimate state, it remains so henceforth. That is, a self-stabilizing system guarantees to converge to a legitimate state in finite time no matter what initial state it may start with; or, it can recover from transient faults automatically without any outside intervention. This chapter first introduces the self-stabilization concept in distributed computing. Next, it discusses the coloring problem on graphs and its applications in distributed computing. Then, it introduces three self-stabilizing algorithms. The first two are for vertex coloring and edge coloring on planar graphs, respectively. The last one is for edge coloring on bipartite graphs.

scholarly journals Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM

Electronics ◽  
2020 ◽  
Vol 9 (12) ◽  
pp. 2074
Author(s):  
J.-Carlos Baraza-Calvo ◽  
Joaquín Gracia-Morán ◽  
Luis-J. Saiz-Adalid ◽  
Daniel Gil-Tomás ◽  
Pedro-J. Gil-Vicente
Keyword(s):  
Fault Tolerance ◽  
Error Correction ◽  
Error Detection ◽  
Fault Injection ◽  
Error Correction Codes ◽  
Transient Faults ◽  
Tolerance Mechanism ◽  
Intermittent Faults ◽  
Risc Processor ◽  
Simulation Based

Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive fault tolerance mechanism based on error correction codes (ECC), able to modify its behavior when the error conditions change without increasing the redundancy. As a case example, we have designed a mechanism that can detect intermittent faults and swap from an initial generic ECC to a specific ECC capable of tolerating one intermittent fault. We have inserted the mechanism in the memory system of a 32-bit RISC processor and validated it by using VHDL simulation-based fault injection. We have used two (39, 32) codes: a single error correction–double error detection (SEC–DED) and a code developed by our research group, called EPB3932, capable of correcting single errors and double and triple adjacent errors that include a bit previously tagged as error-prone. The results of injecting transient, intermittent, and combinations of intermittent and transient faults show that the proposed mechanism works properly. As an example, the percentage of failures and latent errors is 0% when injecting a triple adjacent fault after an intermittent stuck-at fault. We have synthesized the adaptive fault tolerance mechanism proposed in two types of FPGAs: non-reconfigurable and partially reconfigurable. In both cases, the overhead introduced is affordable in terms of hardware, time and power consumption.

Survey on Fault Tolerance Startgies for Advance Microelectronics Chip

2019 ◽  
Vol 7 (1) ◽  
pp. 01-04
Author(s):  
Himanshu Shekhar, Prof. Deepa Gianchandani
Keyword(s):  
Fault Tolerance ◽  
Power Supply ◽  
Fault Tolerant ◽  
Full Adder ◽  
Equipment Design ◽  
Transient Faults ◽  
Transient Fault

In the complex advance microelectronics based system, handling units are managing gadgets of littler size, which are delicate to the transient faults. A framework should be fabricated that will perceive the presence of faults and fuses strategies to will endure these faults without troublesome the typical activity A transient fault happens in a circuit caused by the electromagnetic commotions, astronomical beams, crosstalk and power supply clamor. It is extremely hard to recognize these faults amid disconnected testing. Subsequently a region effective fault tolerant full adder for testing and fixing of transient and changeless faults happened in single and multi-net is proposed. Furthermore, the proposed design can likewise identify and fix perpetual faults. This structure acquires much lower equipment overheads with respect to the conventional equipment design. In this paper, talk about various fault tolerant methodology for CMOS and ICs.

scholarly journals Fault Tolerance in Carbon Nanotube Transistors Based Multi Valued Logic

2021 ◽  
Author(s):  
Gopalakrishnan Sundararajan
Keyword(s):  
Fault Tolerance ◽  
Error Correction ◽  
Field Effect ◽  
Fault Tolerant ◽  
Field Effect Transistors ◽  
Transient Faults ◽  
Carbon Nanotube Transistors ◽  
Nanotube Transistors ◽  
Modular Redundancy ◽  
Carbon Nano Tube

This Chapter presents a solution for fault-tolerance in Multi-Valued Logic (MVL) circuits comprised of Carbon Nano-Tube Field Effect Transistors (CNTFET). This chapter reviews basic primitives of MVL and describes ternary implementations of CNTFET circuits. Finally, this chapter describes a method for error correction called Restorative Feedback (RFB). The RFB method is a variant of Triple-Modular Redundancy (TMR) that utilizes the fault masking capabilities of the Muller C element to provide added protection against noisy transient faults. Fault tolerant properties of Muller C element is discussed and error correction capability of RFB method is demonstrated in detail.

scholarly journals A Self-Checking Hardware Journal for a Fault-Tolerant Processor Architecture

2011 ◽  
Vol 2011 ◽  
pp. 1-15 ◽  
Author(s):  
Mohsin Amin ◽  
Abbas Ramazani ◽  
Fabrice Monteiro ◽  
Camille Diou ◽  
Abbas Dandache
Keyword(s):  
Fault Tolerance ◽  
Error Detection ◽  
Error Control ◽  
Fault Tolerant ◽  
Error Rates ◽  
Main Memory ◽  
Transient Faults ◽  
Processor Core ◽  
Detection Techniques ◽  
Performance Area

We introduce a specialized self-checking hardware journal being used as a centerpiece in our design strategy to build a processor tolerant to transient faults. Fault tolerance here relies on the use of error detection techniques in the processor core together with journalization and rollback execution to recover from erroneous situations. Effective rollback recovery is possible thanks to using a hardware journal and chosing a stack computing architecture for the processor core instead of the usual RISC or CISC. The main objective of the journalization and the hardware self-checking journal is to prevent data not yet validated to be sent to the main memory, and allow to fast rollback execution on faulty situations. The main memory, supposed to be fault secure in our model, only contains valid (uncorrupted) data obtained from fault-free computations. Error control coding techniques are used both in the processor core to detect errors and in the HW journal to protect the temporarily stored data from possible changes induced by transient faults. Implementation results on an FPGA of the Altera Stratix-II family show clearly the relevance of the approach, both in terms of performance/area tradeoff and fault tolerance effectiveness, even for high error rates.

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