HIGH PRESSURE ELECTRICAL RESISTIVITY STUDY ON ORTHORHOMBIC SnTe1−xSx
Keyword(s):
X Ray
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Electrical resistivity measurements under pressure and lattice parameter study on SnTe 1–xSx(0.5≤x≤1) are reported here. The structure of these samples is confirmed by the theoretical calculation of X ray intensities using Lazy-Pulverix programme. The electrical resistivity decreases with the increase of pressure and also with the decrease of sulphur concentration. High pressure electrical resistivity study has produced more evidence that the compounds are layered material.
2007 ◽
Vol 21
(11)
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pp. 675-678
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1997 ◽
Vol 11
(26n27)
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pp. 1189-1192
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2005 ◽
Vol 40
(9)
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pp. 896-897
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1996 ◽
Vol 100
(5)
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pp. 341-343
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2006 ◽
Vol 20
(29)
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pp. 4885-4890
2008 ◽
Vol 403
(5-9)
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pp. 1375-1377
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