ELECTRICAL PROPERTIES OF HETEROLAYERED BaTiO3/(Bi1/2Na1/2)TiO3 THICK FILMS

2009 ◽  
Vol 23 (31n32) ◽  
pp. 3785-3791
Author(s):  
SUNG-PILL NAM ◽  
HYUN-JI NOH ◽  
SUNG-GAP LEE ◽  
SEON-GI BAE ◽  
YOUNG-HIE LEE

The heterolayered BT/BNT thick films were fabricated by screen printing techniques on alumina substrates electrodes with Pt . Their structure and ferroelectric properties were investigated with the heterolayered tetragonal/rhombohedral structure composed of the BT and the BNT thick films. The structural and electrical properties of the heterolayered BT/BNT thick films were studied. The dielectric properties such as dielectric constant, loss and remanent polarization of the heterolayered BT/BNT thick films were superior to those of single composition BNT, and those values for the heterolayered BT/BNT thick films were 1455, 0.025 and 12.63 µC/cm2.

2008 ◽  
Vol 15 (01n02) ◽  
pp. 41-45
Author(s):  
SUNG-GAP LEE ◽  
HYUN-JI NOH ◽  
YOUNG-HIE LEE

Ferroelectric PbZr 0.6 Ti 0.4 O 3 (PZT) thick films were fabricated using a combination of screen-printing method and PZT precursor sol coating process (M. Koch, N. Harris, R. Maas, A. G. R. Evans, N. M. White and A. Brunnschweiler, Meas. Sci. Technol.8 (1997) 49; Y. S. Yoon, J. Korean. Phys. Soc.47 (2005) 321). Structural and electrical properties of the PZT thick films with the treatment of sol coating were investigated. The porosity decreased and the densification was enhanced with increasing the number of sol coatings. All PZT thick films showed the typical X-ray diffraction patterns of a perovskite polycrystalline structure. The thickness of all thick films was approximately 60–61 μm. The relative dielectric constant increased and dielectric loss decreased with increasing the number of sol coatings, and the values of the six-layer PZT-6 film were 167.8, 0.78% at 1 kHz, respectively. The remanent polarization and coercive field of the 6-coated PZT-6 thick films were 14.1 μC/cm2 and 20.3 kV/cm, respectively.


1995 ◽  
Vol 415 ◽  
Author(s):  
T. Ami ◽  
K. Hironaka ◽  
C. Isobel ◽  
N. Nagel ◽  
M. Sugiyama ◽  
...  

ABSTRACTFerroelectric Bi2 SrTa2 O9 thin films were successfully prepared by liquid delivery MOCVD, and structural and electrical properties were investigated. As-deposited films showed sharp distinct peaks, which were indexed assuming a fluorite-type structure. These precursors were transformed to bismuth-layered structures by annealing at 800 °C in flowing oxygen. Reasonable ferroelectric properties were observed in a film with 170 nm-thickness. Remanent polarization and coercive field were estimated to be 5.2 μC/cm2 and 52 kV/cm, respectively, at 5V.


2013 ◽  
Vol 582 ◽  
pp. 55-58 ◽  
Author(s):  
Tomoaki Futakuchi ◽  
Tatsunori Kakuda ◽  
Yuichi Sakai

0.67BiFeO3-0.33BaTiO3thick films were prepared by screen printing pastes prepared by kneading the 0.67BiFeO3-0.33BaTiO3powder in a three-roll mill with an organic vehicle. The thick films were fired with Pt bottom electrodes and ZrO2substrates to investigate the influence of firing temperature. The microstructures and ferroelectric properties of the thick films were examined and compared with the bulk ceramics. A remanent polarization of 32.0 μC/cm2and coercive field of 28 kV/cm were obtained for a thick film with the addition of 0.5 wt% MnO that was fired at 1050 °C.


2009 ◽  
Vol 421-422 ◽  
pp. 148-152
Author(s):  
Yuki Hasegawa ◽  
Masafumi Kobune ◽  
Yusuke Daiko ◽  
Atsushi Mineshige ◽  
Tetsuo Yazawa ◽  
...  

On the basis of experimental data on the piezoelectric pinpoint composition of ceramics of the ternary system Pb(Mg1/3Nb2/3)O3-PbZrO3-PbTiO3 (PMNZT), which we investigated in our previous report, epitaxial PbMg0.047Nb0.095Zr0.416Ti0.442O3 thick films with thicknesses ranging from 0.4 to 1.9 m were fabricated on Pt(100)/MgO(100) substrates by metalorganic decomposition. The film- thickness dependence on the structural and electrical properties (dielectric, piezoelectric and ferroelectric properties) was investigated. All PMNZT films exhibited a highly uniform (001) orientation, regardless of the film thickness. The cross-sectional transmission electron microscope micrographs and all the physical data suggest that high-density PMNZT thick films with a thickness  1.0 m can be expected to function as highly electrically insulating capacitors with high potential for piezo- and ferroelectric applications.


2007 ◽  
Vol 350 ◽  
pp. 115-118 ◽  
Author(s):  
Tomoaki Futakuchi ◽  
Tatsunori Kakuda ◽  
Yuichi Sakai ◽  
Takashi Iijima ◽  
Masatoshi Adachi

Bi4Ti3O12 based thick films were prepared by screen printing and firing using Pt bottom electrodes and ZrO2 substrates. The influence of excess Bi2O3 as sintering aid was investigated. Furthermore, substitution of Ti-site and Bi-site for V5+ and Nd3+ was performed. Screen-printable pastes were prepared by kneading the Bi4Ti3O12 based powder and Bi2O3 powder in a three-roll mill with an organic vehicle. The microstructures and ferroelectric properties of the thick films were examined in comparison with bulk ceramics. The remanent polarization of 9.6 μC/cm2 and coercive field of 64 kV/cm were obtained for the Bi3.0Nd1.0Ti2.99V0.01O12 thick film with 10 wt% of excess Bi2O3 fired at 1200OC.


2007 ◽  
Vol 336-338 ◽  
pp. 381-383
Author(s):  
Sung Gap Lee ◽  
Young Jae Shim ◽  
Cheol Jin Kim ◽  
Won Tae Bae ◽  
Kyu Hong Hwang ◽  
...  

Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(20/80) and PZT(80/20) paste were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated 4 times to form the heterolayered thick films. The thickness of the PZT heterolayered thick films was approximately 60 μm. All PZT thick films showed the typical XRD patterns of a perovskite polycrystalline structure. The relative dielectric constant and the dielectric loss of the PZT thick films sintered at 1050oC were 283 and 1.90%, respectively.


2020 ◽  
Vol 557 (1) ◽  
pp. 18-27
Author(s):  
S. Abhinay ◽  
P. Dixit ◽  
R. Mazumder

The present paper aims to study the effect of different pore forming agent on the density, porosity, pore morphology and electrical properties of porous BZT-0.5BCT ceramics. The electrical property evaluation is focused on dielectric constant, ferroelectric properties (P-E loop) and piezoelectric constant (d33 and g33) of the porous BZT-0.5BCT ceramics. BZT-0.5BCT powder was prepared by solid-state route. The porous ceramic was prepared by mixing BZT-0.5BCT with different percentage (10, 20, 30, 40 and 50 vol%) of polyvinyl alcohol (PVA) and sucrose as pore-forming agents (PFA). As a result, density, relative permittivity, remanent polarization and piezoelectric constant decreased linearly with increase in pore former addition. The pores derived from PVA and sucrose as pore former were spherical to irregular in shape. Isolated pores are observed up to 30 vol% of PFA addition and pore interconnectivity is observed at 40 vol% of PVA and sucrose addition. The decrease in electrical properties is much higher in sucrose when compared with PVA as a pore former.


2007 ◽  
Vol 544-545 ◽  
pp. 633-636
Author(s):  
Sung Gap Lee ◽  
Sang Man Park

Ferroelectric Pb(Zr0.6Ti0.4)O3 (PZT(60/40)) powder was prepared by a sol-gel method and PZT thick films were fabricated by the screen-printing method on the alumina substrates. The Pt bottom electrodes were screen-printed on the alumina substrate. The PZT(60/40) thick films were annealed at 1050°C for 10min in PbO atmosphere. Pb(Zr0.4Ti0.6)O3 (PZT(40/60)) precursor solution, which prepared by sol-gel method, was spin-coated on the PZT thick films to obtain a densification. These PZT multilayered thick films were annealed at 650°C for 2 h in PbO atmosphere. The upper electrodes were fabricated by screen printing the Ag paste and then firing at 590°C for 10min. Its structural and electrical properties of the PZT thick films with the treatment of PZT(40/60) precursor solution coating were investigated. The coating and drying procedure was repeated 4 times. And then the PZT(40/60) precursor solution was spin-coated on the multilayered thick films. A concentration of a coating solution was 1.5 mol/L and the number of coating was repeated from 0~15. The porosity of the thick films was decreased with increasing the number of coatings. All PZT multilayered thick films showed the XRD patterns of typical peroveskite polycrystalline structure. The relative dielectric constant of the PZT-15 (15: number of solution coatings) thick film were 370. And the PZT-15 thick film shows the remanent polarization of 23.5 μC/cm2 and coercive field of 18.0 kV/cm, respectively.


2019 ◽  
Vol 24 (6) ◽  
pp. 126
Author(s):  
Nawar Thamer Mohammed ◽  
Wasfi Mohammed Kadem

In this study (Cobalt oxide) nano powder prepared using sol-gel method with a crystallite size 22 nm By testing XRD  and by matching with card (JCPDS) files No.( 00-042-1467). Electrical and dielectric properties like (Dielectric constant, resistivity, electrical conductivity) are studied by LCR meter with frequency range from (50 Hz) to (5 MHz ). It was noted that the resistivity and dielectric constant was decreasing while electrical conductivity increased with increased  frequency    http://dx.doi.org/10.25130/tjps.24.2019.118  


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