A Free Electron Laser–Photoemission Electron Microscope System (FEL–PEEM)

1998 ◽  
Vol 05 (06) ◽  
pp. 1257-1268 ◽  
Author(s):  
H. Ade ◽  
W. Yang ◽  
S. L. English ◽  
J. Hartman ◽  
R. F. Davis ◽  
...  

We report first results from our effort to couple a high resolution photoemission electron microscope (PEEM) to the OK-4 ultraviolet free electron laser at Duke University (OK-4/Duke UV FEL). The OK-4/Duke UV FEL is a high intensity source of tunable monochromatic photons in the 3–10 eV energy range. This tunability is unique and allows us to operate near the photoemission threshold of any samples and thus maximize sample contrast while keeping chromatic berrations in the PEEM minimal. We have recorded first images from a variety of samples using spontaneous radiation from the OK-4/ Duke UV FEL in the photon energy range of 4.0–6.5 eV. Due to different photothreshold emission from different sample areas, emission from these areas could be turned on (or off) selectively. We have also observed relative intensity reversal with changes in photon energy which are interpreted as density-of-state contrast. Usable image quality has been achieved, even though the output power of the FEL in spontaneous emission mode was several orders of magnitude lower than the anticipated full laser power. The PEEM has achieved a spatial resolution of 12 nm.

2015 ◽  
Vol 22 (3) ◽  
pp. 477-484 ◽  
Author(s):  
Makina Yabashi ◽  
Hitoshi Tanaka ◽  
Tetsuya Ishikawa

In March 2012, SACLA started user operations of the first compact X-ray free-electron laser (XFEL) facility. SACLA has been routinely providing users with stable XFEL light over a wide photon energy range from 4 to 15 keV and an ultrafast pulse duration below 10 fs. The facility supports experimental activities in broad fields by offering high-quality X-ray optics and diagnostics, as well as reliable multiport charge-coupled-device detectors, with flexible experimental configurations. A two-stage X-ray focusing system was developed that enables the highest intensity of 1020 W cm−2. Key scientific results published in 2013 and 2014 in diverse fields are reviewed. The main experimental systems developed for these applications are summarized. A perspective on the facility upgrade is presented.


2020 ◽  
Vol 10 (7) ◽  
pp. 2611
Author(s):  
Hirokatsu Yumoto ◽  
Yuichi Inubushi ◽  
Taito Osaka ◽  
Ichiro Inoue ◽  
Takahisa Koyama ◽  
...  

A nanofocusing optical system—referred to as 100 exa—for an X-ray free-electron laser (XFEL) was developed to generate an extremely high intensity of 100 EW/cm2 (1020 W/cm2) using total reflection mirrors. The system is based on Kirkpatrick-Baez geometry, with 250-mm-long elliptically figured mirrors optimized for the SPring-8 Angstrom Compact Free-Electron Laser (SACLA) XFEL facility. The nano-precision surface employed is coated with rhodium and offers a high reflectivity of 80%, with a photon energy of up to 12 keV, under total reflection conditions. Incident X-rays on the optics are reflected with a large spatial acceptance of over 900 μm. The focused beam is 210 nm × 120 nm (full width at half maximum) and was evaluated at a photon energy of 10 keV. The optics developed for 100 exa efficiently achieved an intensity of 1 × 1020 W/cm2 with a pulse duration of 7 fs and a pulse energy of 150 μJ (25% of the pulse energy generated at the light source). The experimental chamber, which can provide different stage arrangements and sample conditions, including vacuum environments and atmospheric-pressure helium, was set up with the focusing optics to meet the experimental requirements.


2016 ◽  
Vol 23 (2) ◽  
pp. 425-429 ◽  
Author(s):  
Philip Heimann ◽  
Michael MacDonald ◽  
Bob Nagler ◽  
Hae Ja Lee ◽  
Eric Galtier ◽  
...  

The performance of X-ray free-electron laser beamlines may be limited by the angular aperture. Compound refractive lenses (CRLs) can be employed to prefocus the X-ray beam, thereby increasing the beamline transmission. A prefocusing CRL was implemented in the X-ray transport of the Matter under Extreme Conditions Instrument at the Linac Coherent Light Source. A significant improvement in the beamline transmission was calculated over the 3–10 keV photon energy range. At 5 keV, the relative X-ray intensity was measured and a factor of four increase was seen in the beamline transmission. The X-ray focus was also determined by the ablation imprint method.


2021 ◽  
Vol 11 (22) ◽  
pp. 10768
Author(s):  
Ye Chen ◽  
Frank Brinker ◽  
Winfried Decking ◽  
Matthias Scholz ◽  
Lutz Winkelmann

Sub-ångström working regime refers to a working state of free-electron lasers which allows the generation of hard X-rays at a photon wavelength of 1 ångström and below, that is, a photon energy of 12.5 keV and above. It is demonstrated that the accelerators of the European X-ray Free-Electron Laser can provide highly energetic electron beams of up to 17.5 GeV. Along with long variable-gap undulators, the facility offers superior conditions for exploring self-amplified spontaneous emission (SASE) in the sub-ångström regime. However, the overall FEL performance relies quantitatively on achievable electron beam qualities through a kilometers-long accelerator beamline. Low-emittance electron beam production and the associated start-to-end beam physics thus becomes a prerequisite to dig in the potentials of SASE performance towards higher photon energies. In this article, we present the obtained results on electron beam qualities produced with different accelerating gradients of 40 MV/m–56 MV/m at the cathode, as well as the final beam qualities in front of the undulators via start-to-end simulations considering realistic conditions. SASE studies in the sub-ångström regime, using optimized electron beams, are carried out at varied energy levels according to the present state of the facility, that is, a pulsed mode operating with a 10 Hz-repetition 0.65 ms-long bunch train energized to 14 GeV and 17.5 GeV. Millijoule-level SASE intensity is obtained at a photon energy of 25 keV at 14 GeV electron beam energy using a gain length of about 7 m. At 17.5 GeV, half-millijoule lasing is achieved at 40 keV. Lasing at up to 50 keV is demonstrated with pulse energies in the range of a few hundreds and tens of microjoules with existing undulators and currently achievable electron beam qualities.


1986 ◽  
Vol 60 (5) ◽  
pp. 1584-1590 ◽  
Author(s):  
B. Levush ◽  
T. M. Antonsen ◽  
W. M. Manheimer

2019 ◽  
Vol 26 (5) ◽  
pp. 1406-1411 ◽  
Author(s):  
Hiroto Motoyama ◽  
Shigeki Owada ◽  
Gota Yamaguchi ◽  
Takehiro Kume ◽  
Satoru Egawa ◽  
...  

Intense sub-micrometre focusing of a soft X-ray free-electron laser (FEL) was achieved by using an ellipsoidal mirror with a high numerical aperture. A hybrid focusing system in combination with a Kirkpatrick–Baez mirror was applied for compensation of a small spatial acceptance of the ellipsoidal mirror. With this system, the soft X-ray FEL pulses were focused down to 480 nm × 680 nm with an extremely high intensity of 8.8×1016 W cm−2 at a photon energy of 120 eV, which yielded saturable absorption at the L-edge of Si (99.8 eV) with a drastic increase of transmittance from 8% to 48%.


2016 ◽  
Vol 23 (4) ◽  
pp. 869-873 ◽  
Author(s):  
Sven Reiche ◽  
Eduard Prat

With the successful operation of free-electron lasers (FELs) as user facilities there has been a growing demand for experiments with two photon pulses with variable photon energy and time separation. A configuration of an undulator with variable-gap control and a delaying chicane in the middle of the beamline is proposed. An injected electron beam with a transverse tilt will only yield FEL radiation for the parts which are close to the undulator axis. This allows, after re-aligning and delaying the electron beam, a different part of the bunch to be used to produce a second FEL pulse. This method offers independent control in photon energy and delay. For the parameters of the soft X-ray beamline Athos at the SwissFEL facility the photon energy tuning range is a factor of five with an adjustable delay between the two pulses from −50 to 950 fs.


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