Reverse-Mode Single Ion Beam Induced Charge (R-mode SIBIC) Imaging for the Test of Total Dose Effects in n-ch Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET)
1994 ◽
Vol 33
(Part 2, No. 7A)
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pp. L962-L965
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1997 ◽
Vol 15
(6)
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pp. 2342
2021 ◽
Vol 134
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pp. 106046
Keyword(s):
2020 ◽
Vol 21
(3)
◽
pp. 339-347
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1997 ◽
Vol 9
(8)
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pp. 1143-1145
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