Evaluation of Interface States in ZnO Varistors by Spectral Analysis of Deep Level Transient Spectroscopy

1999 ◽  
Vol 38 (Part 1, No. 2A) ◽  
pp. 899-900 ◽  
Author(s):  
Yasuhiro Ohbuchi ◽  
Junya Yoshino ◽  
Yoichi Okamoto ◽  
Jun Morimoto
Keyword(s):  
Spectral Analysis ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Interface States ◽  
Zno Varistors ◽  
Transient Spectroscopy

Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS)

1987 ◽  
Vol 26 (Part 1, No. 10) ◽  
pp. 1634-1640 ◽  
Author(s):  
Jun Morimoto ◽  
Michihiro Fudamoto ◽  
Kenichiro Tahira ◽  
Tatsuo Kida ◽  
Seiji Kato ◽  
...  
Keyword(s):  
Spectral Analysis ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Transient Spectroscopy

Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS) of Deep Centers in CdTe Single Crystals

1988 ◽  
Vol 27 (Part 1, No. 12) ◽  
pp. 2256-2259 ◽  
Author(s):  
Jun Morimoto ◽  
Michihiro Fudamoto ◽  
Shuuji Tashiro ◽  
Masaaki Arai ◽  
Toru Miyakawa ◽  
...  
Keyword(s):  
Spectral Analysis ◽  
Single Crystals ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Deep Centers ◽  
Transient Spectroscopy

Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS) of DX-centers in AlxGa1-xAs:Sn

1988 ◽  
Vol 27 (Part 1, No. 5) ◽  
pp. 738-745 ◽  
Author(s):  
Michihiro Fudamoto ◽  
Kenichiro Tahira ◽  
Jun Morimoto ◽  
Toru Miyakawa
Keyword(s):  
Spectral Analysis ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Dx Centers ◽  
Transient Spectroscopy

A deep-level transient spectroscopy study of silicon interface states using different silicon nitride surface passivation schemes

2010 ◽  
Vol 96 (10) ◽  
pp. 103507 ◽  
Author(s):  
Chun Gong ◽  
Eddy Simoen ◽  
Niels Posthuma ◽  
Emmanuel Van Kerschaver ◽  
Jef Poortmans ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Deep Level Transient Spectroscopy ◽  
Surface Passivation ◽  
Deep Level ◽  
Interface States ◽  
Spectroscopy Study ◽  
Transient Spectroscopy ◽  
Silicon Interface

A Deep-Level Transient Spectroscopy Comparison of the SiO2/Si and Al2O3/Si Interface States

2019 ◽  
Vol 41 (4) ◽  
pp. 37-44 ◽  
Author(s):  
Eddy Simoen ◽  
Aude Rothschild ◽  
Bart Vermang ◽  
Jef Poortmans ◽  
Robert Mertens
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Interface States ◽  
Transient Spectroscopy

Distribution of deep levels in Si:Au by spectral analysis of deep-level transient spectroscopy

1998 ◽  
Vol 66 (3) ◽  
pp. 323-325 ◽  
Author(s):  
J. Yoshino ◽  
Y. Okamoto ◽  
J. Morimoto ◽  
T. Miyakawa
Keyword(s):  
Spectral Analysis ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Deep Levels ◽  
Transient Spectroscopy
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