Radio-Frequency Small-Signal and Noise Modeling for Silicon-on-Insulator Dynamic Threshold Voltage Metal–Oxide–Semiconductor Field-Effect Transistors

2009 ◽  
Vol 48 (4) ◽  
pp. 04C041
Author(s):  
Sheng-Chun Wang ◽  
Pin Su ◽  
Kun-Ming Chen ◽  
Sheng-Yi Huang ◽  
Cheng-Chou Hung ◽  
...  
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