Radio-Frequency Small-Signal and Noise Modeling for Silicon-on-Insulator Dynamic Threshold Voltage Metal–Oxide–Semiconductor Field-Effect Transistors
2007 ◽
Vol 46
(12)
◽
pp. 7635-7638
◽
2010 ◽
Vol 49
(4)
◽
pp. 04DC01
◽
2010 ◽
Vol 49
(2)
◽
pp. 024304
◽
2007 ◽
Vol 46
(9A)
◽
pp. 5691-5694
◽
2003 ◽
Vol 42
(Part 1, No. 5A)
◽
pp. 2560-2563
2018 ◽
Vol 57
(6S1)
◽
pp. 06HD03
◽