Hold time validation on silicon and the relevance of hazards in timing analysis

PURPOSE: This study was intended to determine the effect of skin cooling on breath-hold duration and predicted emergency air supply duration during immersion.METHODS: While wearing a helicopter transport suit with a dive mask, 12 subjects (29 ± 10 yr, 78 ± 14 kg, 177 ± 7 cm, 2 women) were studied in 8 and 20°C water. Subjects performed a maximum breath-hold, then breathed for 90 s (through a mouthpiece connected to room air) in five skin-exposure conditions. The first trial was out of water for Control (suit zipped, hood on, mask off). Four submersion conditions included exposure of the: Partial Face (hood and mask on); Face (hood on, mask off); Head (hood and mask off); and Whole Body (suit unzipped, hood and mask off).RESULTS: Decreasing temperature and increasing skin exposure reduced breath-hold time (to as low as 10 ± 4 s), generally increased minute ventilation (up to 40 ± 15 L · min−1), and decreased predicted endurance time (PET) of a 55-L helicopter underwater emergency breathing apparatus. In 8°C water, PET decreased from 2 min 39 s (Partial Face) to 1 min 11 s (Whole Body).CONCLUSION: The most significant factor increasing breath-hold and predicted survival time was zipping up the suit. Face masks and suit hoods increased thermal comfort. Therefore, wearing the suits zipped with hoods on and, if possible, donning the dive mask prior to crashing, may increase survivability. The results have important applications for the education and preparation of helicopter occupants. Thermal protective suits and dive masks should be provided.Madu VC, Carnahan H, Brown R, Ennis K-A, Tymko KS, Hurrie DMG, McDonald GK, Cornish SM, Giesbrecht GG. Skin cooling on breath-hold duration and predicted emergency air supply duration during immersion. Aerosp Med Hum Perform. 2020; 91(7):578–585.

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Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.2320 ◽

2016 ◽

Vol E99.A (12) ◽

pp. 2320-2327

Author(s):

Cheng-Yu HAN ◽

Yu-Ching LI ◽

Hao-Tien KAN ◽

James Chien-Mo LI

Keyword(s):

Power Supply ◽

Test Pattern ◽

Timing Analysis ◽

Power Supply Noise ◽

Supply Noise

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Diagnose Compound Hold Time Faults Caused by Spot Delay Defects at Clock Tree

ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2011p0103 ◽

2011 ◽

Author(s):

Yu Huang ◽

Wu-Tung Cheng ◽

Ting-Pu Tai ◽

Liyang Lai ◽

Ruifeng Guo ◽

...

Keyword(s):

Hold Time ◽

Clock Signal ◽

Clock Tree ◽

Scan Testing ◽

Design Error ◽

Functional Logic ◽

Scan Chains ◽

Delay Defects

Abstract If a signal on clock tree is slower than expected due to either a design error or a manufacturing defect, it may cause complicated fault behaviors during scan-based testing. It makes the diagnosis of such defect especially difficult if the defective clock signal is used for both shift and capture operations during the scan testing, because (1) the defect induces hold time faults on scan chains during shift cycles, and (2) hold-time faults may also be introduced during capture cycles in the functional logic paths. In this paper we illustrate the failure behaviors of such clock defects and propose an algorithm to diagnose it.

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A New Technique for Scan Chain Failure Diagnosis

ISTFA 2002: Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2002p0723 ◽

2002 ◽

Author(s):

Ruifeng Guo ◽

Srikanth Venkataraman

Keyword(s):

Hold Time ◽

Failure Diagnosis ◽

Second Step ◽

Fault Type ◽

Transition Faults ◽

Input Side ◽

Output Side ◽

A New Technique ◽

Scan Chain ◽

Diagnostic Resolution

Abstract In this paper, we present a scan chain fault diagnosis procedure. The diagnosis for a single scan chain failure is performed in three steps. The first step uses special chain test patterns to determine both the faulty chain and the fault type in the faulty chain. The second step uses a novel procedure to generate special test patterns to identify the suspect scan cell within a range of scan cells. Unlike previously proposed methods that restrict the location of the faulty scan cell only from the scan chain output side, our method restricts the location of the faulty scan cell from both the scan chain output side and the scan chain input side. Hence the number of suspect scan cells is reduced significantly in this step. The final step further improves the diagnostic resolution by ranking the suspect scan cells inside this range. The proposed technique handles both stuck-at and timing failures (transition faults and hold time faults). The experimental results based on simulation and silicon units for several products show the effectiveness of the proposed method.

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