Transfer characteristics and high frequency modeling of logic gates using carbon nanotube field effect transistors (CNT-FETs)

Author(s):  
Jose M. Marulanda ◽  
Ashok Srivastava ◽  
Ashwani K. Sharma
ACS Nano ◽  
2012 ◽  
Vol 6 (5) ◽  
pp. 4013-4019 ◽  
Author(s):  
Li Ding ◽  
Zhiyong Zhang ◽  
Tian Pei ◽  
Shibo Liang ◽  
Sheng Wang ◽  
...  

2007 ◽  
Vol 121-123 ◽  
pp. 693-696 ◽  
Author(s):  
Leonardo C. Castro ◽  
D.L. Pulfrey ◽  
D.L. John

The high-frequency capability of carbon nanotube field-effect transistors is investigated by simulating the small-signal performance of a device with negative-barrier Schottky contacts for the source and drain, and with a small, ungated region of nanotube between the end contacts and the edge of the wrap-around gate electrode. The overall structure is shown to exhibit resonant behaviour, which leads to a significant bias dependence of the small-signal capacitances and transconductance. This could lead to high-frequency figures of merit (fT and fmax) in the terahertz regime.


2012 ◽  
Vol 101 (5) ◽  
pp. 053123 ◽  
Author(s):  
Mathias Steiner ◽  
Michael Engel ◽  
Yu-Ming Lin ◽  
Yanqing Wu ◽  
Keith Jenkins ◽  
...  

2020 ◽  
Vol 12 (24) ◽  
pp. 27461-27466
Author(s):  
Martin Hartmann ◽  
Jana Tittmann-Otto ◽  
Simon Böttger ◽  
Georg Heldt ◽  
Martin Claus ◽  
...  

2012 ◽  
Vol 2012 ◽  
pp. 1-7 ◽  
Author(s):  
S. Hamieh

Compact model of single-walled semiconducting carbon nanotube field-effect transistors (CNTFETs) implementing the calculation of energy conduction subband minima under VHDLAMS simulator is used to explore the high-frequency performance potential of CNTFET. The cutoff frequency expected for a MOSFET-like CNTFET is well below the performance limit, due to the large parasitic capacitance between electrodes. We show that using an array of parallel nanotubes as the transistor channel combined in a finger geometry to produce a single transistor significantly reduces the parasitic capacitance per tube and, thereby, improves high-frequency performance.


2007 ◽  
Vol 91 (14) ◽  
pp. 143118 ◽  
Author(s):  
Shaoning Yuan ◽  
Qing Zhang ◽  
Daisuke Shimamoto ◽  
Hiroyuki Muramatsu ◽  
Takuya Hayashi ◽  
...  

Nanoscale ◽  
2014 ◽  
Vol 6 (15) ◽  
pp. 8956-8961 ◽  
Author(s):  
Jingqi Li ◽  
Qingxiao Wang ◽  
Weisheng Yue ◽  
Zaibing Guo ◽  
Liang Li ◽  
...  

Transfer characteristics of the vertical carbon nanotube field-effect transistors depend on the sign of the drain voltage and type of silicon doping.


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