Fault modeling and characteristics of SRAM-based FPGAs (abstract only)

Author(s):  
Naifeng Jing ◽  
Ju-Yueh Lee ◽  
Chun Zhang ◽  
Jiarong Tong ◽  
Zhigang Mao ◽  
...  
Keyword(s):  
Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.


2021 ◽  
Vol 789 (1) ◽  
pp. 012066
Author(s):  
Ardhan Farisan ◽  
Eko Puswanto ◽  
Deasy Arisa ◽  
Mohammad Al Afif ◽  
Wisnu Priyanto ◽  
...  

Author(s):  
Alexandre Dos Santos Roque ◽  
Nasser Jazdi ◽  
Edison Pignaton De Freitas ◽  
Carlos Eduardo Pereira

2014 ◽  
Vol 63 (9) ◽  
pp. 2145-2159 ◽  
Author(s):  
Shulin Tian ◽  
ChengLin Yang ◽  
Fang Chen ◽  
Zhen Liu

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