Application of Polypyrrole Film Substrates for Characterization of Metallic Electrodeposits by Transmission Electron Microscopy and Electron Diffraction

1991 ◽  
Vol 138 (5) ◽  
pp. 1263-1268 ◽  
Author(s):  
Ngee‐Sing Chong ◽  
Michael L. Norton ◽  
James L. Anderson
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Transmission Electron ◽  
Polypyrrole Film

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

Characterization Of APB's In GaP

1996 ◽  
Vol 442 ◽  
Author(s):  
Dov Cohen ◽  
C. Barry Carter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Antiphase Boundaries ◽  
Beam Electron ◽  
Transmission Electron ◽  
Convergent Beam ◽  
Crystallographic Orientations

AbstractAntiphase boundaries in GaP crystals epitactically grown on Si (001) have been characterized using transmission electron microscopy. Convergent-beam electron diffraction was used to identify the antiphase-related grains. The antiphase boundaries were observed to adopt facets parallel to specific crystallographic orientations. Furthermore, stacking-fault-like contrast was observed along the interface suggesting that the domains may be offset from one another by a rigid-body lattice translation.

Microstructural Characterization of Long-Period Stacking Ordered Phases in Mg97Zn1Y2 (at.%) Alloy

2013 ◽  
Vol 19 (6) ◽  
pp. 1575-1580 ◽  
Author(s):  
Xiaohong Shao ◽  
Huajie Yang ◽  
Jeff T.M. De Hosson ◽  
Xiuliang Ma
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Point Group ◽  
Lattice Parameter ◽  
Space Group ◽  
Lpso Phase ◽  
Long Period ◽  
Transmission Electron

AbstractTransmission electron microscopy characterization of two major long-period stacking ordered (LPSO) phases in Mg–Zn–Y alloy, i.e., 18R- and 14H-LPSO are reported. The space group and atomic-scale microstructures of both compounds were determined using a combination of electron diffraction, convergent beam electron diffraction, high-resolution transmission electron microscopy, and Z-contrast scanning transmission electron microscopy. The 18R-LPSO phase is demonstrated to have a point group and space group 3m and R3m (or 3m and R3m), with the lattice parameter a = 1.112 nm and c = 4.689 nm in a hexagonal coordinate system. The 14H-LPSO phase has a point group 6/mmm and a space group P63 /mmc, and the lattice parameter is a = 1.112 nm and c = 3.647 nm. In addition, insertion of extra thin Mg platelets of several atomic layers, results in stacking faults in the LPSO phase. These results may shed some new light on a better understanding of the microstructure and deformation mechanisms of LPSO phases in Mg alloys.

scholarly journals Transmission electron microscopy as an important tool for characterization of zeolite structures

2018 ◽  
Vol 5 (11) ◽  
pp. 2836-2855 ◽  
Author(s):  
W. Wan ◽  
J. Su ◽  
X. D. Zou ◽  
T. Willhammar
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Electron Tomography ◽  
Structure Characterization ◽  
Transmission Electron ◽  
High Resolution Tem

This review presents various TEM techniques including electron diffraction, high-resolution TEM and scanning TEM imaging, and electron tomography and their applications for structure characterization of zeolite materials.

Characterization of Precipitates in Bend-Age-Formed 2124 Aluminium Alloy

2011 ◽  
Vol 194-196 ◽  
pp. 1275-1279 ◽  
Author(s):  
Li Wei Quan ◽  
Gang Zhao ◽  
Yue Liu ◽  
Ni Tian ◽  
Tao Peng
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Aluminium Alloy ◽  
Nucleation And Growth ◽  
S Phase ◽  
Transmission Electron ◽  
Nucleation Sites ◽  
Preferential Alignment

The precipitates of bending-age-formed ternary Al-4.31Cu-1.51Mg alloy were studied with load of 6.05 kg aged at 190°C. Transmission electron microscopy and electron diffraction has been used to observe the microstructures of the bend-age-formed alloy. The results show that there is no preferential alignment of S phase or GPB zones in the alloys with load compared with that without load. It is interesting to find that the length of S phase is shorter in age-formed sample than that without load. Dislocations generated after loaded can provide enough nucleation sites for the nucleation and growth of S phase.

Fast microstructure and phase analyses of nanopowders using combined analysis of transmission electron microscopy scattering patterns

2014 ◽  
Vol 70 (5) ◽  
pp. 448-456 ◽  
Author(s):  
P. Boullay ◽  
L. Lutterotti ◽  
D. Chateigner ◽  
L. Sicard
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Structure Refinement ◽  
Pattern Search ◽  
Phase Identification ◽  
Combined Analysis ◽  
Transmission Electron ◽  
Diffraction Patterns

The full quantitative characterization of nanopowders using transmission electron microscopy scattering patterns is shown. This study demonstrates the feasibility of the application of so-called combined analysis, a global approach for phase identification, structure refinement, characterization of anisotropic crystallite sizes and shapes, texture analysis and texture variations with the probed scale, using electron diffraction patterns of TiO2and Mn3O4nanocrystal aggregates and platinum films. Electron diffraction pattern misalignments, positioning, and slight changes from pattern to pattern are directly integrated and refined within this approach. The use of a newly developed full-pattern search–match methodology for phase identification of nanopowders and the incorporation of the two-wave dynamical correction for diffraction patterns are also reported and proved to be efficient.

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